Hostname: page-component-5c6d5d7d68-7tdvq Total loading time: 0 Render date: 2024-08-17T20:36:29.910Z Has data issue: false hasContentIssue false

X-Ray Characterization of the Crystallization Process of High-TC Superconducting Oxides in the Sr-Bi-Pb-Ca-Cu-O System

Published online by Cambridge University Press:  28 February 2011

Winnie Wong-Ng
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Chwan K. Chiang
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Stephen W. Freiman
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Lawrence P. Cook
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Nong M. Hwang
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Michael D. Hill
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Get access

Abstract

Phase assemblages in two Sr-Bi-Pb-Ca-Cu-O glasses and their crystallization into glass-ceramics through a sequence of heat treatments are described. Samples were heat treated at various temperatures based on differential thermal analysis (DTA) analysis of the as-quenched glasses. X-ray powder diffraction was used to identify the compounds in each sample; and the different phases formed in these two samples were compared. Results of microstructural characterization of selected samples using scanning electron microscopy are discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Maeda, H., Tanaka, Y., Fukutomi, M. and Asano, T., Jpn. J. Appl. Phys., 27, L209, (1988).Google Scholar
2 Garzon, F.H., Beery, J.G., and Raistrick, I.D., Appl. Phys. Lett., 53, 805, (1988).Google Scholar
3 Hinks, D.G., Soderholm, L., Capone II, D.W., Dabrowski, B., Mitchell, A.W., Shi, D., Appl. Phys. Lett., 53, 423, (1988).Google Scholar
4 Cava, R., Physica (c) , 153, 560 (1988).Google Scholar
5 Yamada, Y. and Muraase, S., Jpn. J. Appl. Phys., 27, L996, (1988).Google Scholar
6 Shi, D., Boley, M. S., Chen, J.G., Xu, M., Vandervoort, K., Liao, X. Y. and Zangvil, A., Appl. Phys. Lett. 55(7), 14, (1989).Google Scholar
7 Uzumaki, T., Yamanaka, K., Kamehara, N. and Niwa, K., Jap. J. Appl. Phys. 28, L75, (1989).Google Scholar
8 Teske, C. and Muller‐Buschbaum, , Z. Anorg. Allg. Chem. 370, 134 (1969).Google Scholar
9 Roth, R.S., Rawn, C., Burton, B.P. and Beech, F., in preparation, (1989).Google Scholar
10 Wong‐Ng, W., Chiang, C.K., Freiman, S.W., Cook, L.P., Hwang, N.M. and Hill, M.D., submitted to Proceeding of the 1st International Ceramic Science & Technology Congress (1989).Google Scholar