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XPS-Study of Excimer Laser-Reconstructed Alumina Surface

Published online by Cambridge University Press:  10 February 2011

D. G. Georgiev
Affiliation:
Laboratory of Solid State Physics, Departement of Materials and Processes, University of Mons-Hainaut, Av.Maistriau 23, Mons 7000, Belgium on leave from CLAPHOP, Bulgarian Academy of Sciences, Sofia 1113, Bulgaria
K. Kolev
Affiliation:
Laboratory of Solid State Physics, Departement of Materials and Processes, University of Mons-Hainaut, Av.Maistriau 23, Mons 7000, Belgium on leave from CLAPHOP, Bulgarian Academy of Sciences, Sofia 1113, Bulgaria
L. D. Laude
Affiliation:
Laboratory of Solid State Physics, Departement of Materials and Processes, University of Mons-Hainaut, Av.Maistriau 23, Mons 7000, Belgium
O. Brouxhon
Affiliation:
LISE - University ND de la Paix, Rue de Bruxelles 61, Namur 5000,Belgium
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Abstract

Sintered alumina ceramics are recognized as important industrial materials. For many of their applications however, a suitable pretreatment is required aiming at improving the ceramic surface properties. Since excimer lasers have recently proved to be efficient in ceramic processing, a detailed investigation of sintered alumina surface modifications upon excimer irradiation has been performed. In a previous work the results of low-angle X-ray diffraction analysis reveal emergence of the alumina gamma-phase within the upper 10nm of the material. This presence is further demonstrated by the XPS-study reported here. The photoelectron data are compared with information obtained by optical methods.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

1. Schmatko, K.J., Endress, G. and Durchholz, H., Proc.5th Int.Conf.Laser in Manufacturing, Sept.1988, pp. 94102 Google Scholar
2. Sowada, U., Ishizaka, S.-I., Kahlert, H.J. and Basting, D., Chemtronics 4 (1989) 9, p. 162.Google Scholar
3. Tönschoff, H.K. and Gedrat, O., OE/Boston '90, Proc. SPIE Vol. 1377 (1990)Google Scholar
4. Geiger, M., Lutz, N. and Biermann, S., Proc.SPIE Vol.1503, p.238(1991)Google Scholar
5. Schutte, K., Bergmann, H.W., Schubert, E. and Queitsch, R., Proc.SPIE Vol.1810, p.562 (1992)Google Scholar
6. Hourdakis, G. and Hontzopoulos, E., Proc.SPIE Vol. 1503, p.249 (1991)Google Scholar
7. Fölser, F., Appl.Phys.A 59, pp. 209213 (1994)Google Scholar
8. Pedraza, A.J., Godbole, M.J., DeSilva, M.J. and Lowndes, D.H., MRS-Symp.Proc. Vol.285, p.203 (1993)Google Scholar
9. Kolev, K., Laude, L.D. and Brunel, M., Proc.SPIE Vol.2207, p.644, 1994 Google Scholar
10. Laude, L.D., Kolev, K., Brunel, M. and Deleter, P., Appl.Surf.Sci. 86, pp.368381 (1995)Google Scholar
11. Cao, S., Pedraza, A.J., Lowndes, D.H. and Allard, L.F., Appl.Phys.Lett. 65 (23), pp. 29402942 (1994)Google Scholar
12. Wagner, C.D., Riggs, W.M., Davis, L.E., Moulder, J.F. and Mullenberg, G.E. in Handbook of X-ray Photoelectron Spectroscopy, Perkin-Elmer Corp., Physical Electronics Division, Eden Prairie, MN 5534 (1979)Google Scholar
13. Wagner, C.D. and Taylor, J.A., J.Electron Spectrosc.Relat.Phenom., 28, p. 211 (1980)Google Scholar
14. Taylor, J.A., J.Vac.Sci.Technol., 20, p.751 (1982)Google Scholar
15. Wagner, C.D., Passoja, D.E., Hillery, H.F., Kinsky, T.G. and Six, H.A., J.Vac.Sci.Tecnol. 21, p.933 1982)Google Scholar
16. Cotton, F.A. and Wilkinson, G. in Advanced Inorganic Chemistry, 3rd ed., Wiley Edition, New York, 1972.Google Scholar
17. Thornton, J.A. and Chin, J., Ceram.Bull. 56,p.504 (1977)Google Scholar
18. Pedraza, A.J., Park, J.W., Lowndes, D.H., Cao, S. and Allen, W.R. in Advanced Laser Processing of Materials - Fundamentals and Applications, edited by Singh, R., Norton, D., Laude, L., Narayan, J. and Cheung, J. (MRS-Symp.Proc.397, Pittsburgh,PA,1996) pp.519524 Google Scholar