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XPS Study of Pt/CexZr1−xO2/Si Composite Systems

Published online by Cambridge University Press:  21 February 2011

A. Norman
Affiliation:
Univ. of Namur, Laboratoire LISE, Namur, elgium.
R. Sporken
Affiliation:
Univ. of Namur, Laboratoire LISE, Namur, Belgium. Robert.sporken@fundp.ac.be
A. Galtayries
Affiliation:
Univ. of Namur, Laboratoire LISE, Namur, elgium.
F. Mirabella
Affiliation:
Univ. of Namur, Laboratoire LISE, Namur, elgium.
K. Keveney
Affiliation:
Ecole des Mines, Saint-Etienne, France.
M. Pijolat
Affiliation:
Ecole des Mines, Saint-Etienne, France.
R. Baker
Affiliation:
Universidad de Cadiz, Cadiz, Spain.
S. Bernal
Affiliation:
Universidad de Cadiz, Cadiz, Spain.
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Abstract

This work describes the study of the surface reduction of ceria zirconia mixed oxides (CeZrO) as either thin films or powders, both with and without Pt present. XPS was used to measure the composition of the surface and the oxidation states of all metals contained within the material. The thin films of CeZrO showed little reactivity towards the reducing conditions used. Grazing incidence angle XRD showed the presence of Ce0.75Zr0.25O2. The thin films prepared with Pt showed that surface reduction of Ce4+ occurred under reducing conditions. The size of the Pt clusters was also determined from the data. The Pt was found to always exist in the metallic state. The Zr4+ was not seen to change during all treatments. For the powder samples the Ce4+ was readily reduced to approximately 60%. Pt was found to be initially oxidised with the % of metallic Pt increasing with reduction temperature. Again no change in the Zr was observed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

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