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Visible Light Emission from Porous Silicon Examined by Photoluminescence and Raman Spectroscopy

Published online by Cambridge University Press:  28 February 2011

Terry R. Guilinger ,
Michael J. Kelly ,
David R. Tallant ,
David A. Redman  and
David M. Follstaedt
Terry R. Guilinger
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
Michael J. Kelly
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
David R. Tallant
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
David A. Redman
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
David M. Follstaedt
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
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Abstract

We describe the acquisition of Raman and photoluminescence (PL) spectra on porous silicon (PS) samples that emit visible light. Spectra were acquired in both ex situ experiments (after exposure to air) and in situ experiments (with the PS covered either with the hydrofluoric acid electrolyte used in the formation process or water). Our results generally show a correlation of blue-shifted PL with increased oxidation. In one set of ex situ experiments, however, we observed an inconsistency in the shift of the wavelengthof maximum luminescence intensity for PS samples that exhibit oxygenated character in the Raman spectra. A higher anodization current density produced a red shift in the PL spectra in one experiment, while chemical dissolution of the PS by hydrofluoric acid produced the well-known blue shift in the other case. In two in situ experiments, we observed very weak and red-shifted PL for a PS sample immersed in HF (compared to the same sample measured later in air) while in another we immersed air-exposed PS in water and observed a 15-fold increase in PL intensity along with a blue shift in the luminescence maximum.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 283: Symposium F – Microcrystalline Semiconductors–Materials Science and Devices , 1992 , 115
Copyright
Copyright © Materials Research Society 1993

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References

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