Hostname: page-component-76fb5796d-25wd4 Total loading time: 0 Render date: 2024-04-27T03:45:38.021Z Has data issue: false hasContentIssue false

UV Photoemission Study of Defect States in Polyethylene Films

Published online by Cambridge University Press:  21 February 2011

W. Pong
Affiliation:
Department of Physics and Astronomy, University of Hawaii, Honolulu, Hawaii 96822
D. Brandt
Affiliation:
Department of Physics and Astronomy, University of Hawaii, Honolulu, Hawaii 96822
A. Sato
Affiliation:
Department of Physics and Astronomy, University of Hawaii, Honolulu, Hawaii 96822
W. Imaino
Affiliation:
IBM Research Laboratory, San Jose, California 95193
M. Farrow
Affiliation:
IBM-IPD Division, Boulder, Co.80302
Get access

Abstract

Photoemission from evaporated Polyethylene films was measured in the spectral region between 6 and 11 eV. A significant increase in photoemission yield was observed after the films were exposed to O2 and to air containing ozone and ions from a diffuse glow discharge at reduced pressures. The enhancement can be attributed to oxygen and ozone reacting with the defects in the evaporated polyethylene films, which are unsaturated carbon double bonds in the polyethylene chain. For the ozonized polymer films deposited on gold substrates, the photoelectron spectra show a relatively high density of occupied states at 6.8 ± 0.3 eV below the vacuum level of the polymer and a photoemission threshold of 3.8 ± 0.3 eV. The implication of the results to contact charging of polyethylene is discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1984

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Lowell, J. and Rose-Innes, A. C., in Advances in Physics 29, 947 (1980).Google Scholar
2. Davies, D. K., in Electrical Properties of Polymers, edited by Seanor, D. A., Academic Press, New York (1982), p. 285.CrossRefGoogle Scholar
3. Hays, D. A., J. Chem. Phys. 61, 1455 (1974).Google Scholar
4. Seki, K., Hashimoto, S., Sato, N., Harada, Y., Ishii, K., Inokuchi, H., and Kanbe, J., J. Chem. Phys. 66, 3644 (1977).Google Scholar
5. Ueno, N., Fukushima, T., Sugita, K., Kiyono, S., Seki, K., and Inokuchi, H., J. Phys. Soc. Jpn. 48, 1254 (1980).Google Scholar
6. Pong, W. and Paudyal, D., Phys. Rev. B 23, 3085 (1981).CrossRefGoogle Scholar
7. Painter, L. R., Arakawa, E. T., Williams, N. W., and Ashley, J. C., Radiation Research 83, 1 (1980).Google Scholar
8. Kiess, H., Progress in Surf. Sci. 9, 113 (1979).Google Scholar
9. Spicer, W. E. and Berglund, C. N., Rev. Sci. Instrum. 35, 1665 (1964).Google Scholar
10. Fujihira, M. and Inokuchi, H., Chem. Phys. Letts. 17, 554 (1972).Google Scholar
11. Kittaka, S. and Murata, Y., Japanese J. Appl. Phys. 18, 515 (1979).Google Scholar
12. George, R. A., Martin, D. H. and Wilson, E. G., J. Phys. C: Solid State Phys. 5, 871 (1972).Google Scholar
13. Haridoss, S., Ferlman, M. M., and Carlone, C., J. Appl. Phys. 53, 6106 (1982).Google Scholar
14. Dekker, A. J., Solid State Physics, Prentice-Hall, Inc., Englewood Cliffs , N.J. (1963), p. 229.Google Scholar
15. Feuchtwang, T. E., Paudyal, D., and Pong, W., Phys. Rev. B 26, 1608 (1982).Google Scholar