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Transient and modulated photoconductivity in microcrystalline silicon

  • R. Brüggemann (a1), C. Longeaud (a2) and J.P. Kleider (a2)


We report on transient and modulated photoconductivity experiments with undoped michrystalline silicon in which access to density-of-states information is limited because the Fermi level results in occupancy of localised states in the energy range which is scanned. Simulation results show that a defect peak will be masked if most of the distribution is occupied because of the Fermi level position and the density-of-states determined from the experimental data is not an image of the true distribution. Another difficulty with obtaining reliable density-of-states distributions in microcrystalline silicon is the metastability of samples with respect ot adsorption of gases. If dark-conductivity changes are large upon heat treatment in vacuum, the modulated and transient photocurrent response are also affected to a large degree and the density-of-states profiles apart form being influenced by the Fermi level position thus also depend on the thermal history of the sample.



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1. Bruggemann, R., Main, C., Berkin, J., Reynolds, S., Philos. Mag. B 62, 29 (1990).
2. Main, C., Bruggemann, R., Webb, D.P., Reynolds, S., Solid State Commun. 83, 401 (1992).
3. Zhong, F., Cohen, J.D., Mater. Res. Soc. Symp. Proc. 258, 813 (1992).
4. Longeaud, C., Kleider, J.P., Phys. Rev. B 48, 8715 (1993).
5. Hattori, al., J. Appl. Phys. 76, 2841 (1994).
6. Main, C., J. Non-Cryst Solids 299–302, 525 (2000).
7. Main, C., MRS Symp. Proc. 467, 167 (1977).
8. Reynolds, S., Main, C., Webb, D.P., Rose, M.J., Philos.Mag. B 80, 547 (2000).
9. Brüggemann, R., Kleider, J.P., Longeaud, C., Mencaraglia, D., Guillet, J., Bourée, J.E., Niikura, C., J. Non-Crystal. Solids 266–269, 258 (2000).
10. Reynolds, S., Smimov, V., Main, C., Carius, R. and Finger, F., Mat. Res. Soc. Symp. Proc. 715, A21.2.1 (2002).
11. Veprek, S., Iqbal, Z., Kühne, R.O., Capezzuto, P., F-A. Sarott, Gimzewski, K., J. Phys. C: Solid State Phys. 16, 6241 (1983).
12. Smimov, V., Reynolds, S., Main, C., Finger, F., Carius, R., J. Non-Crystal. Solids, in print.
13. Brüggemann, R., J. Mat. Sciences Mat. Electronics 14, 639 (2003).
14. Brüggemann, R., Bronner, W., Hierzenberger, A., Schubert, M.B., Zrinscak, I., in Thin Film Materials and Devices–Developments in Science and Technology, edited by Marshall, al. (World Scientific, Singapore, 1999), p. 1.
15. Schubert, M.B., Brüggemann, R., Bilger, G. and Hierzenberger, A., Proc 2nd World Conference on Photovoltaic Energy Conversion, Vienna, edited by Schmidt, J., Ossenbrink, H. A., Helm, P., Ehmann, H., Dunlop, E.D. (E.C. Joint Research Centre, Ispra, 1998), p. 834.
16. Smimov, V., Reynolds, S., Main, C., Carius, R. and Finger, F., MRS. Symp. Proc., this volume.
17. Finger, F., Carius, R., Dylla, T., Klein, S., Okur, S., Gunes, M., IEE Proc. Circuits Devices and Systems 150, 300 (2003).
18. Brüggemann, R., Main, C., Bauer, G.H., MRS Symp. Proc. 258, 693 (1992).
19. Brüggemann, R., Kleider, J.P., Thin Solid Films 403–404, 30 (2002).
20. Brüggemann, R., Phys. status solidi (c) 1, 1227 (2004).

Transient and modulated photoconductivity in microcrystalline silicon

  • R. Brüggemann (a1), C. Longeaud (a2) and J.P. Kleider (a2)


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