Hostname: page-component-848d4c4894-r5zm4 Total loading time: 0 Render date: 2024-07-02T16:34:34.152Z Has data issue: false hasContentIssue false

Time-Resolved Transport of Electrons and Holes in Conjugated Polymers

Published online by Cambridge University Press:  10 February 2011

D. Pinner
Affiliation:
Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 OHE, UK
R. H. Friend
Affiliation:
Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 OHE, UK
N. Tessler
Affiliation:
Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 OHE, UK
Get access

Abstract

Detailed experimental and theoretical analysis of the pulsed excitation of polymer light emitting diodes is presented. We find a set of universal transient features for different device configurations which can be reproduced using our phenomenological numerical model. We find that the temporal evolution of the electroluminescence can be characterised by five main features: i) a delay followed by; ii) fast initial rise at turn-on followed by; iii) a slow rise (slower by at least one order of magnitude); iv) fast modulation (<15ns, unresolved) at turn-off followed by v) a long-lived exponential tail. We suggest a method for extracting mobility values which is found to be compatible with CW drive schemes. Mobilities for holes and electrons are extracted for a poly(p-phenylenevinylene) co-polymer and poly(di-octyl fluorene).

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Karg, S., Dyakonov, V., Meier, M., Riess, W., and Paasch, G., Synth. Met. 67, 165168 (1994).Google Scholar
2 Braun, D., Moses, D., Zhang, C., and Heeger, A. J., Appl. Phys. Lett. 61, 30923094 (1992).Google Scholar
3 Vestweber, H., Sander, R., Greiner, A., Heitz, W., Mahrt, R. F., and Bassler, H., Synth. Metals 64, PP.141145 (1994).Google Scholar
4 Pommerehne, J., Vestweber, H., Tak, Y. H., and Bassler, H., Synthetic Metals 76, 6770 (1996).Google Scholar
5 Baigent, D. R., May, P. G., and Friend, R. H., Synthetic Metals 76, 149152 (1996).Google Scholar
6 Tessler, N., Harrison, N. T., Thomas, D. S., and Friend, R. H., Appl. Phys. Lett. 73, 732734 (1998).Google Scholar
7 Tessler, N., Harrison, N. T., and H., F. R., Adv. Mater. 10, 6468 (1998).Google Scholar
8 Chayet, H., Pogreb, R., and Davidov, D., Phys. Rev. B - Cond. Matt. 56, 1270212705 (1997).Google Scholar
9 Blom, P. W. M. and Vissenberg, M. C. J. M., Phys. Rev. Lett. 80, 38193822 (1998).Google Scholar
10 Sturm, J. C., Wilson, W., and lodice, M., leee J. Selected Topics In Quantum Electronics 4, 7582 (1998).Google Scholar
11 Harrison, N. T., Tessler, N., Moss, C. J., Pichler, K., and Friend, R. H., Optic. Mater. 9, 178182 (1998).Google Scholar
12 Kim, S., Granstrom, M., Friend, R. H., Johansson, N., Salaneck, W. R., Daik, R., Feast, W. J., and Cacialli, F., Journal of Applied Physics 84, 68596870 (1998).Google Scholar
13 Carter, S. A., Angelopoulos, M., Karg, S., Brock, P. J., and Scott, J. C., Appl. Phys. Lett. 70, 20672069 (1997).Google Scholar
14 Carter, J. C., Grizzi, I., Heeks, S. K., Lacey, D. J., Latham, S. G., May, P. G., delospanos, O. R., Pichler, K., Towns, C. R., and Wittmann, H. F., Appl. Phys. Lett. 71, 3436 (1997).Google Scholar
15 Pinner, D. J., Friend, R. H., and Tessler, N., (To be published).Google Scholar
16 Vanderauweraer, M., Deschryver, F. C., Borsenberger, P. M., and Bassler, H., Adv. Mater. 6, 199213 (1994).Google Scholar
17 Schein, L. B., Peled, A., and Glatz, D., Journal of Applied Physics 66, 686692 (1989).Google Scholar
18 loannidis, A., Forsythe, E., Gao, Y., Wu, M. W., and Conwell, E. M., Appl. Phys. Lett. 72, 30383040 (1998).Google Scholar
19 Conwell, E. M. and Wu, M. W., Appl. Phys. Lett. 70, 18671869 (1997).Google Scholar
20 Blom, P. W. M. and deJong, M. J. M., leee Journal of Selected Topics in Quantum Electronics 4, 105112 (1998).Google Scholar
21 Redecker, M. and Bradley, D. D. C., Appl. Phys. Lett. 73, 15651567 (1998).Google Scholar