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Time-Resolved Measurements of Solidification and Undercooling in Metals and Alloys

Published online by Cambridge University Press:  25 February 2011

Harry A. Atwater ,
Jeffrey A. West ,
Patrick M. Smith ,
M.J. Aziz ,
J.Y. Tsao ,
P.S. Peercy  and
Michael O. Thompson
Harry A. Atwater
Affiliation:
California Institute of Technology, Pasadena, CA 91125
Jeffrey A. West
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
Patrick M. Smith
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
M.J. Aziz
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
J.Y. Tsao
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
P.S. Peercy
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
Michael O. Thompson
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853
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Abstract

We have performed nanosecond-resolution measurements of the lateral electrical resistivity of thin metal films on insulating substrates. Comparison of transient resistivity measurements with optical reflectivity measurements and heat-flow calculations permits the determination of the position and velocity of a planar crystal/melt interface, and an estimate of undercooling during pulsed laser melting of metals. We report detailed results for rapid solidification of Ni, including the observation of hypercooling of .liquid Ni.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 157: Symposium A – Beam-Solid Interactions: Physical Phenomena , 1989 , 369
Copyright
Copyright © Materials Research Society 1990

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References

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