Skip to main content Accessibility help
×
Home

Temperature Dependence of Ag/Ni Multilayer Microstructure Studied by in Situ X-Ray Diffraction

  • V. Ghetta (a1), J. P. Senateur (a2), J. La manna (a2), G. Delabouglise (a2), I. Matko (a2), B. Chenevier (a2), P. Sandstrom (a3) and J.-E. Sundgren (a3)...

Abstract

The temperature evolution of the microstructure in a series of [111] fiber textured Ag/Ni multilayer samples has been studied by in situ X-ray diffraction. From the recorded pattern analysis, two regimes can be distinguished. At low temperature (TGB = 120–130°C) where diffusion is likely insignificant, the observed reduction of the width and the increase of the intensity (sharp and quick in some cases) of 111 line-profiles indicate that microstress and defects densities possibly located in column/grain boundaries are considerably lowered. At higher temperatures, diffusion of Ag leads to a transformation of the multilayer stacking essentially characterized by the formation of long Ag coherent domains with (111) planes parallel to the film surface accompanied with a similar but minor effect on Ni. In Ag, some 002 texture component also appears upon annealing. A simple model is proposed to describe the metal recrystallization competing with areas where the multilayer stacking is kept nearly unchanged.

Copyright

References

Hide All
1. Chiang, W.-C. and Baxter, D. V., J. Appl. Phys. 74, p. 4331 (1993).
2. Chiang, W.-C., Kim, Soo-Kil and Baxter, D. V., in Nanophase and Nanocomposite Materials, edited by Komami, S., Parker, J. C. and Thomas, G. J. (Mat. Res. Soc. Symp. Proc. 286, Pittsburgh, PA 1993), p. 367.
3. Sandstrdm, P., Svedberg, E. B., Johansson, M., Birch, J., Sundgren, J.-E., submitted to Thin Sol. Films (March 1999).
4. Ghetta, V., Sénateur, J. P., Manna, J. La and Chenevier, B., in preparation.
5. Floro, J. A., Thompson, C. V., Carel, R., Bristowe, P. D., J. Mater. Res. 9, p. 2411 (1994).
6. Matko, I., private communication.

Temperature Dependence of Ag/Ni Multilayer Microstructure Studied by in Situ X-Ray Diffraction

  • V. Ghetta (a1), J. P. Senateur (a2), J. La manna (a2), G. Delabouglise (a2), I. Matko (a2), B. Chenevier (a2), P. Sandstrom (a3) and J.-E. Sundgren (a3)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed