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Synthesis and Electrical Characterization of Tin Oxide Nanostructures

Published online by Cambridge University Press:  31 January 2011

Olivia Maria Berengue ,
Cleocir J. Dalmaschio ,
Tiago G. Conti ,
Adenilson J. Chiquito  and
Edson R. Leite
Olivia Maria Berengue
Affiliation:
oliberengue@yahoo.com.brolimb@df.ufscar.br, Federal University of São Carlos, Nanolab, Department of Physics, São Carlos, Brazil
Cleocir J. Dalmaschio
Affiliation:
Dalmaschio@fakemail.com, Federal University of São Carlos, LIEC, Department of Chemistry, Brazil, Brazil
Tiago G. Conti
Affiliation:
Tiago_conti@fakemail.com, Federal University of São Carlos, LIEC, Department of Chemistry, Brazil, Brazil
Adenilson J. Chiquito
Affiliation:
Adenilson@fakemail.com, Federal University of São Carlos, Nanolab, Department of Physics, São Carlos, Brazil
Edson R. Leite
Affiliation:
Leite@fakemail.com, Federal University of São Carlos, LIEC, Department of Chemistry, Brazil, Brazil
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Abstract

Sn3O4 nanobelts were grown by a carbothermal evaporation process of SnO2 powders in association with the well known vapour-solid mechanism (VS). The nanobelts crystal structure was investigated by x-ray diffraction (XRD), high resolution transmission electron microscopy (HRTEM), raman spectroscopy and field emission gun scanning electron microscopy (FEG-SEM). The structural and morphological characterization has confirmed the growth of single crystal nanobelts. The electrical characterization (current-voltage, temperature-dependent resistance curves) of individual Sn3O4 nanobelts was performed at different temperatures and light excitation. The experiments revealed a semiconductor – like character as evidenced by the resistance decreasing at high temperatures. The transport mechanism was identified as the variable range hopping.

Keywords

nanoscaleelectrical propertiesoxide
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1178: Symposium AA – Semiconductor Nanowires–Growth, Size-Dependant Properties and Applications , 2009 , 1178-AA06-33
Copyright
Copyright © Materials Research Society 2009

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References

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