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Synchrotron-based spectroscopy for the characterization of surfaces and interfaces in chalcopyrite solar cells

Published online by Cambridge University Press:  01 February 2011

Iver Lauermann ,
Paul Pistor ,
Immo Kötschau  and
Marcus Bär
Iver Lauermann
Affiliation:
Hahn-Meitner-Institut, Glienicker Str. 100, D-14109 Berlin, Germany
Paul Pistor
Affiliation:
Hahn-Meitner-Institut, Glienicker Str. 100, D-14109 Berlin, Germany
Immo Kötschau
Affiliation:
Hahn-Meitner-Institut, Glienicker Str. 100, D-14109 Berlin, Germany
Marcus Bär
Affiliation:
Hahn-Meitner-Institut, Glienicker Str. 100, D-14109 Berlin, Germany
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Abstract

In this paper we describe synchrotron based, state-of-the-art spectroscopic methods for the analysis of surfaces and interfaces in thin film photovoltaic devices, their merits and their limitations. Using results obtained with the “CISSY” end station at the BESSY synchrotron in Berlin, Germany, we show how surface sensitive Synchrotron excited X-ray Photoelectron Spectroscopy (SXPS) and Soft X-ray Emission Spectroscopy (SXES), which yields compositional and chemical depth information in the ten to hundred nm scale, have increased our knowledge of the chemistry of surfaces and buried interfaces of these systems.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 865: Symposium F – Thin-Film Compound Semiconductor Photovoltaics , 2005 , F2.1
Copyright
Copyright © Materials Research Society 2005

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