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Synchrotron Microtomography of Composites

Published online by Cambridge University Press:  21 February 2011

S. R. Stock ,
J. H. Kinney ,
T. M. Breunig ,
U. Bonse ,
S. D. Antolovich ,
Q. C. Johnson  and
M. C. Nichols
S. R. Stock
Affiliation:
Mechanical Properties Research Laboratory and School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245, USA
J. H. Kinney
Affiliation:
Chemistry and Materials Science Department, Lawrence Livermore National Laboratory, Livermore, CA 94550, USA
T. M. Breunig
Affiliation:
Mechanical Properties Research Laboratory and School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245, USA
U. Bonse
Affiliation:
Department of Physics, Dortmund University, FRG
S. D. Antolovich
Affiliation:
Mechanical Properties Research Laboratory and School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245, USA
Q. C. Johnson
Affiliation:
Chemistry and Materials Science Department, Lawrence Livermore National Laboratory, Livermore, CA 94550, USA
M. C. Nichols
Affiliation:
Exploratory Chemistry Division, Sandia National Laboratory, Livermore, CA, USA
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Abstract

X-ray computed tomography (CT) uses absorption profiles from many different viewing directions to reconstruct the two-dimensional distribution of x-ray absorptivity within a slice of the sample. The tunability, high brightness and parallelism of synchrotron radiation are critical to high resolution (0.001mm), high contrast (1%) CT or microtomography. In situ study of samples multiple times during the course of an experiment is exciting to consider.

Continuous fiber SiC/Al composites were deformed under three-point bending, and the resulting damage and fiber arrangement were revealed with synchrotron microtomography. Several hundred slices of 0.012 mm thickness were recorded simultaneously using 25 key radiation and a phosphor screen/charge coupled device (CCD) detector. Reconstruction was with the filtered back projection method. Low density regions were observed in the matrix in regions of highest stress where cracking is expected.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 143: Symposium V – Synchrotron Radiation in Materials Research , 1988 , 273
Copyright
Copyright © Materials Research Society 1989

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References

1. Armstrong, H. H., “Satellite Applications of Metal-Matrix composites,” SAMPE National Symposium, May 1979.Google Scholar
2. Amateau, M. F., J. Composite Matls. 10, (1976).Google Scholar
3. Kwal, M. H. and Min, B. K., J. Composite Matls. 18, 619 (1984).Google Scholar
4. Glocher, R. and Frohnmayer, W., Ann. Phys. Leipzig 76, 369 (1925).CrossRefGoogle Scholar
5. Grodzins, L., Nucl. Instrum. Methods 206, 541 (1983); 206, 547 (1983).Google Scholar
6. Kinney, J. H., Johnson, Q. C., Nichols, M. C., Bonse, U. and Nusshardt, R., Appl. Optics 25, 4583 (1986).CrossRefGoogle Scholar
7. Kak, A. C. and Slaney, M., Principles of Computerized Tomographic Imaging, (IEEE Press, New York, 1987).Google Scholar
8. Sequin, F. H., Burstein, P., Bjorkholm, P. J., Homburger, F. and Adams, R. A., Appl. Optics 24, 4117 (1985).Google Scholar
9. Armistead, R. A., Advanced Matls. and Processes/Metals Programs, March 1988, p. 42.Google Scholar
10. Elliott, J. C. and Dover, S. D., J. Microscopy 138, 329 (1985).Google Scholar
11. Bowen, D. K., Elliott, J. C., Stock, S. R. and Dover, S. D., in X-ray Imaging II edited by Knight, L. V. and Bowen, D. K. (SPIE Bellingham, WA, 1986) p. 94.Google Scholar
12. Stock, S. R., Guvenilir, A., Starr, T. L., Elliott, J. C., Anderson, P., Dover, S. D. and Bowen, D. K., in Advanced Characterization Techniques in Ceramics (in press).Google Scholar
13. Kinney, J. H., Johnson, Q. C., Bonse, U., Nichols, M. C., Saroyan, R. A., Nusshardt, R., Pahl, R. and Brase, J. M., MRS Bull. XIII, 13 (1988).Google Scholar
14. Hirano, T., Usani, K., Sakamoto, K. and Suzuki, Y., in Photon Factory Activity Report 1987 (KEK Report 87−2, Tsukuba, Japan) p. 187.Google Scholar
15. Flannery, B. P., Deckman, H., Roberge, W. and D'Amico, K., Science 237, 1439 (1987).CrossRefGoogle Scholar
16. Hwang, W. and Han, K. S., J. Composite Matls. 20, 125 (1986).Google Scholar
17. Johnson, W. S., NASA Tech. Mem. 89116, March 1987.Google Scholar
18. Aboudi, J., Composites Sci. and Tech. 28, 103 (1987)Google Scholar
19. Nusshardt, R. and Bonse, U., private communication (1988).Google Scholar
20. Stock, S. R., Elliott, J. C., Breunig, T., Guvenilir, A., Antolovich, S. D. and Anderson, P., unpublished data (1988).Google Scholar