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Surface, Interface and Thin-Film Magnetism: An Overview

  • L. M. Falicov (a1)


A brief review of the state of the art in the field of surface, interface and thin-film magnetism is presented.



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[1] For a comprehensive review of the field see Falicov, L. M., Pierce, D. T., Bader, S. D., Gronsky, R., Hathaway, K. B., Hopster, H. J., Lambeth, D. N., Parkin, S. S. P., Prinz, G., Salamon, M. B., Schuller, I. K., and Victora, R. H., J. Mater. Res. 5, 1299 (1990).
[2] Moruzzi, V. L., Janak, J. F. and Williams, A. R., Calculated Electronic Properties of Metals (Pergamon, New York, 1978).
[3] Hathaway, K. B., Jansen, H. J. F., and Freeman, A. J., Phys. Rev. B 31, 7603 (1985).
[4] Wang, C. S. and Callaway, J., Phys. Rev. B 15, 298 (1977).
[5] Jarlborg, T. and Peter, M., J. Magn. Magn. Mat. 42, 89 (1984).
[6] A discussion of some discrepancies between theory and de Haas - van Alphen data for Co may be found in: Himpsel, F. J. and Eastman, D. E., Phys. Rev. B 21, 3207 (1980).
[7] See, for example, Victora, R. H. in Magnetic Properties of Low-Dimensional Systems, edited by Falicov, L. M. and Moran-Lpez, J. L. (Springer Verlag, Berlin-Heidelberg-New York-Tokyo, 1986), p. 25.
[8] Kosterlitz, J. M. and Thouless, D. J., in Progress in Low Temperature Physics, edited by Brewer, D. F. (North Holland, Amsterdam,1978), Volume VII B.
[9] Lipowsky, R., Phys. Rev. Lett. 49, 1575 (1982); R. Lipowsky and W. Speth, Phys. Rev. B 28, 2983 (1983); R. Lipowsky, Z. Phys. B. 55, 345 (1984); R. Lipowsky, Phys. Rev. Lett. 52, 1429 (1984); R. Lipowsky, Phys. Rev B 32, 1731 (1985); R. Lipowsky, Ferroelectrics, 73, 69 (1987); R. Lipowsky in Random Fluctuations and Pattern Growth, ed. by H. E. Stanley and N. Ostrowsky (Kluwer Academic, Dordrecht, 1988).
[10],Dietrich, S., in Phase Transitions and Critical Phenomena, edited by Domb, C. and Leibowitz, J. L. (Academic Press, London, 1988), Volume 8, p. 1.
[11] Taylor, G. R., Isin, A. and Coleman, R. V., Phys. Rev. 165, 621 (1968); R. V. Coleman, R. C. Morris, and D. J. Sellmyer, Phys. Rev. B 8, 317 (1973); R. W. Klaffky and R. V. Coleman, Phys. Rev. B 10, 4803 (1974).
[12] Cabrera, G. G. and Falicov, L. M., phys. stat. solidi (b), 61, 539 (1974); R. V. Coleman, R. C. Morris, and D. J. Sellmyer, Phys. Rev. 62, 217 (1974); G. G. Cabrera and L. M. FalTcov, Phys. Rev. B 11, 2651 (1975).
[13] Brown, W. F., Micromagnetics (Wiley, New York, 1963).
[14] Liu, C. and Bader, S. D., Physica B 161, 253 (1989).
[15] Blègel, S., Weinert, M. and Dedericks, P. H., Phys. Rev. Lett. 60, 1077 (1988).
[16] Allan, G., Surf. Sci. 74, 79 (1978).
[17] Grempel, D. R., Phys. Rev. B 24, 3928 (1981).
[18] Victora, R. H. and Falicov, L. M., Phys. Rev. B 31, 7335 (1985).
[19] Macedo, W. A. A. and Keune, W., Phys. Rev. Lett. 61, 475 (1988).
[20] Moruzzi, V. L., Marcus, P. M., Schwarz, K. and Mohn, P., Phys. Rev. B 34, 1784 (1986); P. M. Marcus, V. L. Moruzzi, Z. Q. Wang, Y. S. Li and-F. Jena, in Physical and Chemical Properties of Thin Metal Overlayers and Alloy Surfaces, edited by D. M. Zener and D. W. Goodman, Materials Research Society Symposia Proceedings, volume 83 (Mat. Res. Soc., Pittsburgh, 1987) p. 21.
[21] Prinz, G. A., Phys. Rev. Lett. 54, 1051 (1985).
[22] Prinz, G. A., Jonker, B. T., Krebs, J. J., Ferrari, J. M. and Kovanis, F., Appl. Phys. Lett. 48, 1756 (1986).
[23] Weller, D. and Alvarado, S. F., J. Appl. Phys. 59, 2908 (1986).
[24] Kwo, J., McWhan, D. B., Hong, M., Gyorgy, E. M., Feldman, L. C. and Cunningham, J. E., in Layered Structures, Epitaxy and Interfaces edited by Gibson, J. M. and Dawson, L. R., Materials Research Society Symposia Proceedings, volume 37 (Mat. Res. Soc., Pittsburgh, 1985) p. 509.
[25] Homma, H., Yang, K., and Schuller, I. K., Phys. Rev. B 36, 9435 (1987).
[26] Berkowitz, A. E. and Grenier, J. H., J. Appl. Phys. 36,73330 (1965); J. Bransky, I. Bransky and A. A. Hirsch, J. Appl. Phys. 41, 183 (1970).
[27] Alexander, K. B., Conner, J. R., List, F. A., McKee, R. A., and Walker, F. J. (private communication).
[28] Berkowitz, A. (private communication).
[29] Freeman, A. J. and Fu, C. L., in Magnetic Properties of Low-Dimensional Systems, edited by Falicov, L. M. and Moran-Lopez, J. L. (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1986) p. 16.
[30] Wang, D. S., Freeman, A. L. and Krakauer, H., Phys. Rev. B 24, 1126 (1981).
[31] Falicov, L. M., Victora, R. H. and Tersoff, J., in The Structure of Surfaces, edited by Hove, M. A. Van and Tong, S. Y. (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1985) p. 12, and references therein.
[32] Victora, R. H. and Falicov, L. M., Phys. Rev. B 31, 7335 (1985).
[33] Klebanoff, L. E., Victora, R. H., Falicov, L. M. and Shirley, D. A., Phys. Rev. B 32, 1997 (1985).
[34] Tersoff, J. and Falicov, L. M., Phys. Rev. B 26, 6186 (1982).
[35] Victora, R. H., Ishida, S. and Falicov, L. M., Phys. Rev. B 30, 3896 (1984).
[36] Hasegawa, H., J. Phys. F.: Met. Phys. 16, 1555 (1986).
[37] Hermsmeier, B., Osterwalder, J., Friedman, D., and Fadley, C. S., Phys. Rev. Lett. 62, 478 (1989).
[38] Majkrzak, C.F., Cable, J. W., Kwo, J., Hong, M., McWhan, D. B., Yafet, Y., Waszczak, J. V. and Vettier, C., Phys. Rev. Lett. 56, 2700 (1986).
[39] Salamon, M. B., Sinha, S., Rhyne, J. J., CunnTngham, J. E., Erwin, R. W., Borchers, J. and Flynn, C. P., Phys. Rev. Lett. 56, 259 (1986).
[40] Yafet, Y., Kwo, J., Hong, M., Majkzak, C. F. and O'Brien, T., J. Appl. Phys. 63, 3453 (1988)
[41] Carbone, C. and Alvarado, S. F., Phys. Rev. B 36, 2433 (1987).
[42] Grunberg, P., Schreiber, R., Pang, Y., Brodsky, M. B. and Sowers, H., Phys. Rev. Lett. 57, 2442 (1986); F. Saurenbach, U. Walz, L. Hinchey, P. Grunberg and W. Zinn, J. Appl. Phys. 63, 3473 (1988).
[43] Heinrich, B., Celinski, Z., Cochran, J. F., Muir, W. B., Rudd, J., Zhong, Q. M., Arrott, A. S., Myrtle, K., and Kirschner, J., Phys. Rev. Lett 64, 673 (1990).
[44] Baibich, M. N., Broto, J. M., Fert, A., Dau, F. Nguyen Van, Petroff, F., Etienne, P., Creuzet, G., Friederich, A. and Chazelas, J., Phys. Rev. Lett. 61, 2472 (1988).
[45] Parkin, S. S. P., More, N., and Roche, K. P., Phys. Rev. Lett. 64, 2304 (1990);,S. S.,P. Parkin, A. Mansour, and G. P. Felcher, Appl. Phys. Lett. (to appear); S. S. P. Parkin, R. Bhadra, and K. P. Roche (private communication); S. S. P. Parkin and D. Mauri (private communication).
[46] Cebollada, A., Martinez, J. L., Gallego, J. M., Miguel, J. J. de, Miranda, R., Ferrer, S., Batallan, F., Fillion, G., and Rebouillat, J. P., Phys. Rev. B. 39, 9726 (1989).
[47] See the various contributions included in these proceedings.
[48] Hasegawa, H., Phys. Rev. B 42, 2368 (1990); see also these proceedings.
[49] Wang, Y., Levy, P. M., and Fry, J. L., Phys. Rev. Lett. 65, 2732 (1990); P. M. Levy, J. L. Fry, and E. C. Ethridge, these proceedings.
[50] Edwards, D. M., Mathon, J., Muniz, R. B., and Phan, M. S. (private communication)
[51] Mathon, G., these proceedings.
[52] Herman, F., Sticht, J., Schilfgaarde, M. Van, and Methfessel, M., these proceedings.
[53] Jensen, P. J., Bennemann, K. H., Mokrani, A., and Dreysse, H., these proceedings.
[54] Deaven, D. and Rokhsar, D. S., Bull Am. Pys. Soc. 36, 844 (1991).
[55] Jonker, B. T., Walker, K. H., Kisker, E., Prinz, G. A., and Carbone, C., Phys. Rev. Lett. 57, 142 (1986).
[56] Gutierrez, C. J., Mayer, S. H., Qiu, Z. Q., Tang, H., and Walker, J. C., in Growth, Characterization and Properties of Ultrathin Magnetic Films and Multilayers, edited by Jonker, B. T., Marinero, E. E., and Heremans, J. P., Materials Research Society Symposia Proceedings, volume 13 151 (Mat. Res. Soc., Pittsburgh, 1989), p. 17.
[57] Mathon, J., Rep. Prog. Phys. 51, 1 (1988).
[58] Mathon, J. and Ahmad, S.B., Phys. Rev. B 37, 660 (1988); J. Mathon, Physica 149B, 31 (1988).
[59] Mauri, D., Scholl, D., Siegmann, H.C., and Kay, E., Phys. Rev. Lett. 62, 1900 (1988).
[60] Moodera, J. S. and Meservey, R., Phys. Rev. B 34, 379 (1986).
[61] Slonczewski, J. C., Phys. Rev. B 39, 6995 (1958).
[62] Julliere, M., Phys. Lett. 54A, 225(1975).
[63] Tedrow, P. M. and Meservey, R., Phys. Rev. B 7, 318 (1973).
[64] Gaefvert, U. and Maekawa, S., IEEE Trans. Mag. MAG- 18, 707 (1982).
[65] Erwin, R. W., Rhyne, J. J., Salamon, M. B., Borchers, J., Sinha, S., Du, R., Cunningham, J. E. and Flynn, C. P., Phys. Rev. B 35, 6808 (1987).
[66] Yang, K. Y., Homma, H., and Schuller, I. K., J. Appl. Phys. 63, 4066 (1988).
[67] Borchers, J. A., Nieuwenhuys, G., Salamon, M. B., Flynn, C. P., Du, R., Erwin, R. W. and Rhyne, J. J., J. de Physique 49–C8, 1685 (1988).
[68] See for instance, Schuller, I. K. and Homma, H., Mat. Res. Soc. Bulletin XII, 1 (1987).
[69] See various articles in Physics, Fabrication and Applications of Multilayered Structures, edited by Dhez, P. and Weisbuch, C. (Plenum Press, New York, 1988).
[70] Colvard, C., Merlin, R., Klein, M. V. and Gossard, A. C., Phys. Rev. Lett. 45, 298 (1980).

Surface, Interface and Thin-Film Magnetism: An Overview

  • L. M. Falicov (a1)


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