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Surface Crystallization and Thin Film Melting in Normal Alkanes

Published online by Cambridge University Press:  15 February 2011

X. Z. Wu
Affiliation:
Physics Dept., Northern Illinois Univ. and Materials Science Div., Argonne Natl. Lab.
H. H. Shag
Affiliation:
Dept. of Physics, The Ohio State University, Columbus, OH 43210 Corporate Research Science Laboratories, Exxon Research and Engineering Co., Route 22 East, Annandale, NJ 08801
B. M. Ocko
Affiliation:
physics Department, Brookhaven National Laboratory, Upton, NY 11973
M. Deutsch
Affiliation:
physics Department, Bar Ilan University, Ramat Gan 52900, Israel
S. K. Sinha
Affiliation:
Corporate Research Science Laboratories, Exxon Research and Engineering Co., Route 22 East, Annandale, NJ 08801
M. W. Kim
Affiliation:
Corporate Research Science Laboratories, Exxon Research and Engineering Co., Route 22 East, Annandale, NJ 08801
H. E. King JR.
Affiliation:
Corporate Research Science Laboratories, Exxon Research and Engineering Co., Route 22 East, Annandale, NJ 08801
E. B. Sirota
Affiliation:
Corporate Research Science Laboratories, Exxon Research and Engineering Co., Route 22 East, Annandale, NJ 08801 invited speaker
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Abstract

Normal alkanes of carbon number n>14 exhibit surface crystallization at their liquid-vapor interface. This has been investigated with x-ray reflectivity, grazing incidence scattering and surface tension measurements. The structure and thermodynamics of the surface layer is consistent with a monolayer of the bulk rotator phase occurring at the surface above the bulk melting temperature. On the other hand, thin films of alkanes on SiO2, exhibit a reduction of the melting temperature. The surface crystalline phase is observed for carbon number n>14. The vanishing of surface phase for small n may be due to a transition from surface freezing to surface melting behavior. These measurements can yield the relative surface energies of the various phases.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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