Hostname: page-component-8448b6f56d-jr42d Total loading time: 0 Render date: 2024-04-24T11:01:47.651Z Has data issue: false hasContentIssue false

Substrate Effects on the Structure and Optical Properties of Epitaxial PbTiO3 Thin Films Prepared by Metal-Organic Chemical Vapor Deposition

Published online by Cambridge University Press:  15 February 2011

C. M. Foster
Affiliation:
Materials Science Division, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439
Z. Li
Affiliation:
Materials Science Division, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439
G. R. Bai
Affiliation:
Materials Science Division, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439
H. You
Affiliation:
Materials Science Division, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439
D. Guo
Affiliation:
Materials Science Division, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439
H. L. M. Chang
Affiliation:
Materials Science Division, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439
Get access

Abstract

Epitaxial PbTiOM3 films were prepared by metal-organic chemical vapor deposition (MOCVD) on MgO(001), SrTiO3 (001) and LaAlO3 (001) surfaces. Four-circle X-ray diffraction and optical waveguiding experiments were performed to characterize the deposited films. The films on all three substrates were single-crystal; however, the domain structure of the films was strongly dependent on the substrate material. Films on MgO and LaAlO3 substrates showed a large amount of 90° domain structures, whereas, the degree of twinning was greatly suppressed for films on SrTiO3. The refractive indices and optical birefringence of the films were measured as a function of wavelength using the film-prism coupling method. We found that for films on LaAlO3 (001), the ordinary index and for films on MgO(001) both the ordinary and extraordinary refractive indices were higher than those of bulk single-crystal PbTiO3. For films grown on SrTiO3 (001), the ordinary refractive index was very close to that of single crystal PbTiO3. We correlate the increased refractive index and the reduced birefringence to the degree of epitaxial strain and twinning in the samples, respectively.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. For example see, Ferroelectric Thin Films III, ed. Myers, E. R., Tuttle, B. A., Desu, S. B., and Larsen, P. K., (Mat. Res. Soc. Symp. Proc. Vol.310, San Francisco, CA 1993).Google Scholar
2. Brierley, C. J., Trundle, C., Considine, L., Whatmore, R. W., and Ainger, F. W., Ferroelectrics 90, 181 (1989); A. I. Kingon, K. Y. Hsieh, L. L. King, S. H. Rou, K. J. Backmann, and R. F. Davis, in Ferroelectric Thin Films, ed. by Myers, E. R. and Kingon, A. I., (Mat. Res. Soc. Symp. Proc. Vol.200, Pittsburg, PA 1990); T. Katayama, M. Fuzimoto, M. Shimizu, and T. Shiosaki, Jpn. J. Appl. Phys. 30, 2189 (1991).Google Scholar
3. Bai, G. R., Chang, H. L. M., Kim, H. K., Foster, C. M., and Lam, D. J., Appl. Phys. Lett 64, 408 (1992); Y. Gao, G. Bai, K. L. Merkle, Y. Shi, H. L. M. Chang, Z. Shen, and D. J. Lam, J. Mater. Res. 8, 145 (1993).Google Scholar
4. Bai, G. R., Chang, H. L. M., Foster, C. M., Shen, Z., and Lam, D. J., J. Mater. Res. 9, 156 (1994).CrossRefGoogle Scholar
5. You, H., Chang, H. L. M., Chiarello, R. P., and Lam, D. J., in Heteroepitaxy of Dissimilar Materials, ed. by Ferrow, R. F. C., Harbison, J. P., Peercy, P. S., and Zangwill, A. (Mat. Res. Soc. Symp. Proc. Vol.221, Pittsburg, PA 1990) p. 181.Google Scholar
6. Foster, C. M., Chan, S.-K., Chang, H. L. M., Chiarello, R. P., Zhang, T. J., Guo, J., and Lam, D. J., J. Appl. Phys. 73, 7823 (1993).CrossRefGoogle Scholar
7. Bennett, J. M. and Glassman, A. T., in Handbook of Laser Science and Technology Vol.4, Optical Materials: Part 2, Ed. by Weber, M. J., (CRC Press, Inc., Boca Raton, FL, 1988).Google Scholar