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A Study of the Copper Wire Ball Bonding Processes

Published online by Cambridge University Press:  25 February 2011

Fang Hongyuan
Affiliation:
Doctor, Harbin Institute of Technology, Dept. of Welding, Harbin, The People's Republic of China.
Qian Yiyu
Affiliation:
Professor, Harbin Institute of Technology, Dept. of Welding, Harbin, The People's Republic of China.
Jiang Yihong
Affiliation:
Professor, Harbin Institute of Technology, Dept. of Welding, Harbin, The People's Republic of China.
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Abstract

Copper ball bonding is a new technology which is expected to replace the traditional gold ball bonding and paid attention in woled recently, the technology is very important to reduce cost and improve reliability of microelectronic components. In this paper, the copper wire ball bonding processes have been studied by means of the MW-EFO metal wire ball forming device and the JWYH-2 thermosonic ball bonder. The bond strength of the ball bond under varied ultrasonic power and bonding time have been tested. The tested results show that the maximal strength of copper ball bond can be over 20g, it has advantage over the gold wire ball bonding. In this paper, the deformation process of the copper ball bond has been analyzed and viewed by SME.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. Hongyuan, F., Electronics Process Technology, No. 10, (1987), (in Chinese).Google Scholar
2. Kurty, J., Proceedings, 34th Electronic Components Conference, IEEE Transactions, PP. 712 (1984).Google Scholar
3. Hirote, J., Proceedings, 35th Electronic Components Conference, IEEE Transactions, PP. 116121 (1985).Google Scholar
4. Astumi, K., Proceedings, 36th Electronic Components Conference, IEEE Transactions, PP. 312317 (1986).Google Scholar
5. Iongyuan, F., Annual Meeting of the Welding Institution CHES, H-XIX-006–90.Google Scholar