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Study of the Buried Interface Behavior of Liquid Crystal Thin Films Using Synchrotron Radiation and Grazing Incidence x-ray Scattering Mode

Published online by Cambridge University Press:  10 February 2011

Y. Hu  and
L.J. Martínez-Miranda
Y. Hu
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, MD 20742, yufeihu@eng.umd.edu
L.J. Martínez-Miranda
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, MD 20742, yufeihu@eng.umd.edu
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Abstract

We have used the intensity and tunability of a synchrotron x-ray source in order to access the buried interface between a glass substrate and a liquid crystal thin film. We find that for energy of 9.4kev, the x-rays can penetrate a 0.22mm substrate. Grazing Incidence x-ray Scattering has been used to study the alignment of the films as a function of depth and temperature. Our results indicate the presence of both a chevron structure and a structure similar to the helical twist-grainboundary (TGB) phase. Some films have a disordered interfacial layer. This technique can be applied in the study of semiconductor devices as well as surfactant film interfaces.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 201
Copyright
Copyright © Materials Research Society 2000

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References

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