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Study of Elastic Behavior of Metallic Thin Films by 2D Synchrotron XRD and in situ Tensile Testing

  • Geandier Guillaume (a1), Renault Pierre-Olivier (a2), Goudeau Philippe (a3), Eric Le Bourhis (a4) and Girault Baptiste (a5)...

Abstract

Understanding the mechanical behaviour of nano-structured thin films in relation to their structure, in particular to the grain size, is of high importance for the development of technological applications. Model nanometric multilayer W/Au systems exhibiting different structures are elaborated. These films are supported by a (thin) polyimide substrate. Films mechanical response is characterized experimentally by tensile tests carried out in-situ in a X-ray diffractometer installed on a synchrotron source. X-ray diffraction in transmission geometry has been used to study the deformations of both phases as a function of applied load. This geometry has been developed in the aim of optimizing the experiment time.

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Study of Elastic Behavior of Metallic Thin Films by 2D Synchrotron XRD and in situ Tensile Testing

  • Geandier Guillaume (a1), Renault Pierre-Olivier (a2), Goudeau Philippe (a3), Eric Le Bourhis (a4) and Girault Baptiste (a5)...

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