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Study of CIGS Solar Cells Back Contact

Published online by Cambridge University Press:  01 February 2011

Sylvain Marsillac  and
Himal Khatri
Sylvain Marsillac
Affiliation:
sxm@physics.utoledo.edu, University of Toledo, Physics and Astronomy, 2801 W. Bancroft Street, Mail Stop #111, Toledo, OH, 43606, United States
Himal Khatri
Affiliation:
Himal.khatri@utoledo.edu, Wright Center for Photovoltaic Innovation and Commercialization, Physics and Astronomy, University of Toledo, 2801 W. Bancroft Street, Mail Stop #111, Toledo, OH, 43606, United States
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Abstract

Molybdenum thin films were deposited by r.f. magnetron sputtering. The strain in the films was mostly tensile and varied, with the Argon pressure and the r.f. power, along a bell curve, reaching a maximum at 8 mTorr (80 W) and 6 mTorr (100 W). The grain size deduced from the X-Ray diffraction measurements (FWHM) decreased with increasing Argon pressure and, to a lower extent, with decreasing r.f power. The change in grain size, as well as in morphology, was confirmed by AFM imaging. Finally, the resistivity of the films was found to increase with increasing Argon pressure, while the films maintained good adhesion to the soda-lime glass substrates for all Argon pressures and r.f. power.

Keywords

sputteringphotovoltaicthin film
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1012: Symposium Y – Thin-Film Compound Semiconductor Photovoltaics-2007 , 2007 , 1012-Y03-03
Copyright
Copyright © Materials Research Society 2007

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