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Studies of Critical Current Density Enhancement in (Cax Y1−x)Ba2Cu4O8 (1:2:4)

Published online by Cambridge University Press:  28 February 2011

P. K. Narwankar
Affiliation:
Department of Materials Science and Mineral Engineering, University of California Berkeley, CA 94720 Morris Research, Inc., 1918University Avenue, Berkeley, CA 94704
M. R. Chandrachood
Affiliation:
Department of Materials Science and Mineral Engineering, University of California Berkeley, CA 94720
M. Fendorf
Affiliation:
Department of Materials Science and Mineral Engineering, University of California Berkeley, CA 94720 Materials Science Division, Lawrence Berkeley Laboratory 1 Cyclotron Road, Berkeley, CA 94720
D. E. Morris
Affiliation:
Morris Research, Inc., 1918University Avenue, Berkeley, CA 94704
A. P. B. Sinha
Affiliation:
Department of Materials Science and Mineral Engineering, University of California Berkeley, CA 94720
R. Gronsky
Affiliation:
Department of Materials Science and Mineral Engineering, University of California Berkeley, CA 94720 National Center for Electron Microscopy, Lawrence Berkeley Laboratory 1 Cyclotron Road, Berkeley, CA 94720
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Abstract

Samples with the stoichiometry (CaxY1−x)Ba2Cu4O8, x = 0, 0.1 were synthesized at P(O2) = 25 and 200 bar. High Resolution TEM images for the samples synthesized at 25 bar show a high density of planar defects as compared to almost defect free microstructure of Ca0.1Y0.9Ba2Cu4O8 synthesized at 200 bar. The intragrain critical current density of the high defect density samples is however about 100 times lower that that of Ca0.1Y0.9Ba2Cu4O8 synthesized at P(O2) = 200 bar.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

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