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Structural Properties of Self-Assembled Poly(zinc-bisquinoline)

Published online by Cambridge University Press:  10 February 2011

D. L. Thomsen III ,
T. Phely-Bobin  and
F. Papadimitrakopoulos
D. L. Thomsen III
Affiliation:
Department of Chemistry, Polymer Science Program Nanomaterials Optoelectronics Laboratory, Institute of Materials Science, University of Connecticut, Storrs, CT 06269-3136
T. Phely-Bobin
Affiliation:
Department of Chemistry, Polymer Science Program Nanomaterials Optoelectronics Laboratory, Institute of Materials Science, University of Connecticut, Storrs, CT 06269-3136
F. Papadimitrakopoulos*
Affiliation:
Department of Chemistry, Polymer Science Program Nanomaterials Optoelectronics Laboratory, Institute of Materials Science, University of Connecticut, Storrs, CT 06269-3136
*
*To whom correspondence should be addressed
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Abstract

Poly(zinc-bisquinoline) synthesized via a reactive self-assembly technique has been used as an active transport and emitting layer in light emitting diodes. This small molecule self-assembly, pioneered in our laboratory, was shown for the first time to produce pinhole-free films as thin as 400 Å. The ellipsometric trajectory and the refractive index of zinc bisquinoline self-assembled films on silicon were determined using spectroscopic ellipsometry. Psi and Del values were extrapolated at 633nm and 70 deg incidence for films ranging in thicknesses from 0 nm to 125 nm and plotted with model trajectories of 1.65, 1.70, and 1.75 refractive indices. Thin films over 20 nm followed a trajectory having similiar refractive indices between 1.65 and 1.70, indicative of homogenous films. A refractive index of 1.68 ± 0.01 at 633 nm was found to be among the highest reported values for a self-assembled metallorganic multilayer. Atomic force microscopy of a 90 Å film on silicon substrates with mean square roughness of c.a. 12 Å showed an approximate roughness of 14 - 17 Å.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 488: Symposium J – Electrical, Optical & Magnetic Properties of Organic IV , 1997 , 759
Copyright
Copyright © Materials Research Society 1998

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