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Structural Characterization of MBE Grown (001) CdTe Films by Means of Transmission Electron Microscopy, Low Temperature Photoluminescence and Double Crystal Rocking Curves.*

  • M. G. Burke (a1), W. J. Choyke (a1) (a2), N. J. Doyle (a2), Z. C. Feng (a1), M. H. Hanes (a2) and A. Mascarenhas (a1)...

Abstract

The effects of chemical etching, mechanical thinning, and ion milling on the low temperature photoluminescence spectra of MBE grown (001) CdTe films are reported. Line defects observed by TEM are correlated with photoluminescence. It is shown that X-ray D.C.R.C, measurements in these films are weighted averages over the whole thickness of the films and therefore weakly reflect the structural perfection of the samples near the surface as deduced by photoluminescence.

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This work was supported in part by NSF Grant No. DMR-84–03596.

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1) Feng, Z.C., Mascarenhas, A., Choyke, W.J., Farrow, R.F.C., Greggi, J. Jr, and Shirland, F.A.: Appl. Phys. Lett., 1986, 47, 24.
2) Feng, Z.C., Mascarenhas, A., Choyke, W.J., Farrow, R.F.C., Greggi, J. Jr, and Shirland, F.A.: MRS Symposia Proceedings Vol. 56, Layered Structures and Epitaxy, ed. Gibson, M., Osbourn, G.C., Tromp, R.M., 1986.
3) Feng, Z.C., Mascarenhas, A. and Choyke, W.J., J. of Lum., Vol. 35 (1986), 329.
4) Choyke, W.J., Burke, M.G., Feng, Z.C., Hanes, M.H. and Mascarenhas, A., Proc. of the “14th Intl. Conf. on Defects in SemiconductorsParis (1986).
5) Hall, E.L., D. Phil. Thesis, Massachusetts Institute of Technology (1977).
6) Cullis, A.G., Chew, N.G. and Hutchinson, J.L., Ultramicroscopy, Vol. 17 (1985), p. 203.

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