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Structural Characterization of InAs/(GaIn)Sb Superlattices for IR Optoelectronics

  • J. Wagner (a1), J. Schmitz (a1), F. Fuchs (a1), U. Weimar (a1), N. Herres (a1), G. Tränkle (a1) and P. Koidl (a1)...

Abstract

We report on the structural characterization of InAs/(GaIn)Sb superlattices (SL) grown by solid-source molecular-beam epitaxy. SL periodicity and overall structural quality were assessed by high-resolution X-ray diffraction and Raman spectroscopy. Spectroscopic ellipsometry was found to be sensitive to the (GaIn)Sb alloy composition.

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Structural Characterization of InAs/(GaIn)Sb Superlattices for IR Optoelectronics

  • J. Wagner (a1), J. Schmitz (a1), F. Fuchs (a1), U. Weimar (a1), N. Herres (a1), G. Tränkle (a1) and P. Koidl (a1)...

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