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Strain-Induced Recrystallization of Tial

Published online by Cambridge University Press:  26 February 2011

C. R. Feng ,
D. J. Michel  and
C. R. Crowe
C. R. Feng
Affiliation:
Naval Research Laboratory, Washington, DC 20375-5000
D. J. Michel
Affiliation:
Naval Research Laboratory, Washington, DC 20375-5000
C. R. Crowe
Affiliation:
Naval Research Laboratory, Washington, DC 20375-5000
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Abstract

Transmission electron microscope investigation of extruded and rolled XD™ titanium aluminide sheet has shown the development of recrystallized TiAl regions adjacent to grains which exhibit submicron scale TiAl twins. Detailed diffraction analysis confirmed that the TiAl twins were separated by a layer of Ti3Al. This is consistent with previous observations of the microstructure of extruded XD™ titanium aluminide. In the extruded material, however, the scale of the twins was larger, but the extent of the recrystallized region was smaller. The evidence suggests that the recrystallization of the TiAl regions may result from the impingement of twins from adjacent grains.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 133: Symposium H – High-Temperature Ordered Intermetallic Alloys III , 1988 , 669
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Feng, C.R., Michel, D.J. and Crowe, C.R., Scripta Metall., 22, 1481 (1988).CrossRefGoogle Scholar
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3. Feng, C.R., Michel, D.J. and Crowe, C.R. (to be published).Google Scholar
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5. Schwartz, D.S., McDonnel Douglas Research Laboratories, St. Louis, MO (private communication).Google Scholar