Hostname: page-component-77c89778f8-7drxs Total loading time: 0 Render date: 2024-07-19T23:14:29.620Z Has data issue: false hasContentIssue false

Strain, Stress, and Magnetic Surfaceanisotropy of Epitaxial FE(110)/MO (110) Multilayers

Published online by Cambridge University Press:  15 February 2011

R.M. Osgood III
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305
B.M. Clemens
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305
R.L. White
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305
S. Brennan
Affiliation:
Stanford Synchrotron Radiation Laboratory
Get access

Abstract

Grazing incidence and asymmetric X-ray diffraction were used to measure the stress and strain state of Fe(110)/Mo(110) Multilayers. The highest stress in the Fe constituent of the multilayer was along the [110] in-plane direction and was due to interaction with the substrate. The Magnetic anisotropy of the Fe Multilayer constituent was measured and the magnetic surface anisotropy, which favored in-plane [001] magnetization, was deduced. In contrast, the magnetic surface anisotropy of a single layer of Fe on W preferred in-plane [110] magnetization, in agreement with the Néel Model.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Elmers, H. J. and Gradmann, U.. App. Phys. A., 51, 1990. Google Scholar
[2] Néel, L.. Journal Physics Radium 15:255, 1954. Google Scholar
[3] Clemens, B.M., Osgood, R.M., Payne, A.P., Lairson, B.M., Brennan, S., White, R.L., and Nix, W. D.. In-situ observation of anisotropie strain relaxation in epitaxial Fe(llO) films on Mo(110). J. Mag. Magnetic Mats., 121, 1993. Google Scholar
[4] Bain, J.A.. Structural Characterization of Metallic Thin Films and Multilayers Using X-ray Diffraction. PhD thesis, Stanford University, 1993. Google Scholar
[5] Bain, J.A., Chyung, L.J., Brennan, S., and Clemens, B.M.. Phys. Rev. B page 1184, 1991. Google Scholar
[6] Nix, W.D.. Private Communication.Google Scholar
[7] Gradmann, U. and Waller, G.. Surface Science, 116, 1982.Google Scholar