Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-06-23T09:47:37.178Z Has data issue: false hasContentIssue false

Stability of Self-Assembled Organic-Inorganic Layered Perovskite

Published online by Cambridge University Press:  10 February 2011

Nobuaki Kitazawa
Affiliation:
Department of Materials Science and Engineering, National Defense Academy, 1–10–20 Hashirimizu, Yokosuka, Kanagawa 2398686, Japan
Takafumi Yamamoto
Affiliation:
Department of Materials Science and Engineering, National Defense Academy, 1–10–20 Hashirimizu, Yokosuka, Kanagawa 2398686, Japan
Yoshihisa Watanabe
Affiliation:
Department of Materials Science and Engineering, National Defense Academy, 1–10–20 Hashirimizu, Yokosuka, Kanagawa 2398686, Japan
Yoshikazu Nakamura
Affiliation:
Department of Materials Science and Engineering, National Defense Academy, 1–10–20 Hashirimizu, Yokosuka, Kanagawa 2398686, Japan
Get access

Abstract

Photo-stability of (C6H5C2H4NH3)2PbX4 (X; Br and I) films was studied and the degradation processes were discussed. The prepared films were not stable against the UV-light irradiation. The PhE-PbX4 films were readily oxidized by the UV-light irradiation in air. In vacuum, the PhE-PbI4 films changed to β-phenethylamine intercalated PbI2 due to the elimination of halogen species. On the contrary, no degradation was observed for the PhE-PbBr4 films. These results suggested that the photo-irradiation induced photochemical reaction was one of the possible reasons for the degradation. To suppress the oxidation and halogen elimination induced by the photochemical reaction, PMMA-coated PhE-PbX4 films were also fabricated and their photo-stability was examined.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Calabrese, J., Jpnes, N. L., Harlow, R. L., Herron, N., Thorn, D. L. and Wang, Y., J. Am. Chem. Soc., 113 (1991) 2328.10.1021/ja00006a076Google Scholar
2. Mitzi, D.B., Chem. Mater., 8 (1996) 791.10.1021/cm9505097Google Scholar
3. Ishihara:, T. Optical Properties of Low-Dimensional Materials, eds. T., Ogawa and Y., Kanemitsu (World Scientific, Singapore, 1995) p. 288.Google Scholar
4. Ishihara, T., Takahashi, J. and Goto, T., Phys. Rev., B42 (1990) 11099.10.1103/PhysRevB.42.11099Google Scholar
5. Kitazawa, N., Mater. Sci. Eng., B49 (1997) 233.10.1016/S0921-5107(97)00132-3Google Scholar
6. Era, M., Morimoto, S., Tsutsui, T. and Saito, S., AppL Phys. Lett., 65 (1994) 676.10.1063/1.112265Google Scholar
7. Kondo, T., Iwamoto, S., Hayase, S., Tanaka, K., Ishi, J., Mizuno, M., Ema, K. and Ito, R., Solid State Commun., 105 (1998) 503.10.1016/S0038-1098(97)10166-1Google Scholar
8. Kondo, T., Azuma, T.. Yuasa, T. and Ito, R., Solid State Commun., 105 (1998) 253.10.1016/S0038-1098(97)10085-0Google Scholar
9. Mehrotra, V., Lombardo, S., Thompson, M. O. and Giannelies, E. P., Phys. Rev., B44 (1991) 5786.10.1103/PhysRevB.44.5786Google Scholar
10. Kitazawa, N., Jpn. J. Appl. Phys.,36 (1997) 6876.10.1143/JJAP.36.6876Google Scholar