Hostname: page-component-76fb5796d-zzh7m Total loading time: 0 Render date: 2024-04-25T12:55:07.074Z Has data issue: false hasContentIssue false
  • English
  • Français

Spin-Orbital Coupling Effects on Magnetoresistance in Organic Light-Emitting Diodes

Published online by Cambridge University Press:  26 February 2011

Bin Hu  and
Yue Wu
Bin Hu
Affiliation:
bhu@utk.edu, University of Tennessee, Department of Materials Science and Engeering, 608 Dougherty Hall, Knoxville, TN, 37996, United States, 1-865-974-3946
Yue Wu
Affiliation:
ywu2@utk.edu, University of Tennessee, Department of Materials Science and Engineering, Knoxville, TN, 37996, United States
Get access

Abstract

The magnetoresistance of conjugated polymer poly [2-methoxy-5-(2'-ethylhexyloxy)-1,4-phenylenevinylene] (MEH-PPV) based organic light-emitting diodes (OLED) was investigated at both forward and reverse bias at liquid nitrogen temperature. We find that the reverse bias yields a largely increased magnetoresistance when the electron-hole capture zone is away from the metal electrode as compared to the forward bias with the electron-hole capture zone close to the metal electrode. The electroluminescence suggests that the deposited metal atoms enhance the spin-orbital coupling at the polymer/metal interface and consequently lead to electron-hole capture zone-dependent magnetic field effects in organic semiconductor devices.

Keywords

luminescencemagnetoresistance (magnetic)optoelectronic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 965: Symposium S – Organic Electronics – Materials, Devices and Applications , 2006 , 0965-S03-08
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Johnson, R. C., Merrifield, R. E., Avakian, P., andFlippen, R. B., Phys. Rev. Lett. 19, 285 (1967).Google Scholar
2. Ern, V. andMerrifield, R. E., Phys. Rev. Lett. 21, 609 (1968).Google Scholar
3. Ito, F., Ikoma, T., Akiyama, K., Kobori, Y., andTero-Kubota, S., J. Am. Chem. Soc. 125, 4722 (2003).Google Scholar
4. Davis, A. H. andBussmann, K., J. Vac. Sci. Technol. A 22, 1885 (2004).Google Scholar
5. Salis, G., Alvarado, S. F., Tschudy, M., Brunschwiler, T., andAllenspach, R., Phys. Rev. B 70, 085203 (2004).Google Scholar
6. Kalinowski, J., Cocchi, M., Virgili, D., Fattori, V., Marco, P. Di, Phys. Rev. B 70, 205303 (2004).Google Scholar
7. Francis, T. L., Mermer, Ö., Veeraraghavan, G., andWohlgenannt, M., New J. Phys. 6,185 (2004).Google Scholar
8. Mermer, Ö., Veeraraghavan, G., Francis, T. L., andWohlgenannt, M., Solid State Communications 134, 631 (2005).Google Scholar
9. Sheng, Y., Nguyen, T. D., Veeraraghavan, G., Mermer, Ö., Wohlgenannt, M., Qiu, S., andScherf, U., Phys. Rev. B 74, 045213 (2006).Google Scholar
10. Frankevich, E. L., Lymarev, A. A., Sokolik, I., Karasz, F. E., Blumstengel, S., Baughman, R. H., andHörhold, H. H., Phys. Rev. B 46, 9320 (1992).Google Scholar
11. Kalinowski, J., Cocchi, M., Virgili, D., Marco, P. Di, andFattori, V., Chem. Phys. Lett. 380, 710 (2003).Google Scholar
12. Merrifield, R. E., J. Chem. Phys. 48, 4318 (1968).Google Scholar
13. Agranovich, V. M., Basko, D. M., Schmidt, K., LaRocca, G. C., Bassani, F., Forrest, S., Leo, K., andLidzey, D., Chem. Phys. 272, 159 (2001).Google Scholar
14. Parker, I. D., J. Appl. Phys. 75, 1656 (1994).Google Scholar
15. Koch, N., Kahn, A., Ghijsen, J., Pireaux, J.-J., Schwartz, J., Johnson, R. L., andElschner, A., Appl. Phys. Lett. 82, 70 (2003).Google Scholar
16. Greenwald, Y., Xu, X., Fourmigué, M., Srdanov, G., Koss, C., Wudl, F., andHeeger, A. J., J. Polym. Sci.: Part A: Polym. Chem. 36, 3115 (1998).Google Scholar
17. Hu, B. andKarasz, F. E., Chem. Phys. 227, 263 (1998).Google Scholar
18. Kalinowski, J., Szmytkowski, J., andStampor, W., Chem. Phys. Lett. 378, 380 (2003).Google Scholar
19. Wittmer, M. andZschokke-Gränacher, I., J. Chem. Phys. 63, 4187 (1975).Google Scholar
20. Prigodin, V. N., Bergeson, J. D., Lincoln, D. M., andEpstein, A. J., Synth. Met. 156, 757 (2006)Google Scholar
21. Wilkinson, J., Davis, A. H., Bussmann, K., andLong, J. P., Appl. Phys. Lett. 86, 111109 (2005).Google Scholar
22. Finkenzeller, W. J. andYersin, H., Chem. Phys. Lett. 377, 299 (2003).Google Scholar