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Spectroellipsometry Studies of Znl-x.cdxSe: From Optical Functions to Heterostructure Characterization

  • Joungchel Lee (a1), Byungyou Hong (a1), J. S. Burnham (a1), R. W. Collins (a1), F. Flack (a2) and N. Samarth (a2)...

Abstract

The dielectric functions of 0.5–1.5 μm Znl-xCdxSe (0≤x≤0.34) epilayers on GaAs have been determined over the photon energy range 1.5≤E≤5.3 eV. These spectra have been parameterized using the Sellmeier approximation for energies less than the fundamental gap at E0 and using a sum of Lorentz oscillators above the gap region. As an example of the usefulness of the approach, expressions are provided that yield the index of refraction of Znl-xCdxSe (0≤x≤ 0.34) for 1.5 eV≤E<E0- As a second example, we have determined the composition and thickness of a Znl-xCdxSe quantum well between ZnSe barrier layers.

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[1] See for example, II-VI Semiconducting Compounds, edited by Thomas, D.G (W.A. Benjamin, New York, 1967).
[2] Samarth, N., Luo, H., Furdyna, J.K., Alonso, R.G., Lee, Y.R., Ramdas, A.K., Qadri, S.B., and Otsuka, N., Appl. Phys. Lett. 56, 1163 (1990).
[3] Erman, M., Theeten, J.B., Vodjdani, N., and Demay, Y., J. Vac. Sci. Technol. B 1, 328 (1983).
[4] Snyder, P.G., Rost, M.C., Bu-Abbud, G.H., Woollam, J.A., and Alterovitz, S.A., J. Appl. Phys. 60, 3293 (1986).
[5] Heyd, A.R., Collins, R.W., Vedam, K., Bose, S.S., and Miller, D.L., Appl. Phys. Lett. 60, 2776 (1992).
[6] Terry, F.L., J. Appl. Phys. 70, 409 (1991).
[7] Snyder, P.G., Woollam, J.A., Alterovitz, S., and Johs, B., J. Appl. Phys. 68, 5925 (1990).
[8] Adachi, S. and Taguchi, T., Phys. Rev. B 43, 9569 (1991). See references therein for earlier optical studies based on reflectance.
[9] Kim, Y.-D., Cooper, S.L., Klein, M.V., and Jonker, B.T., Appl. Phys. Lett. 62, 2387 (1993).
[10] Dahmani, R., Salamanca-Riba, L., Nguyen, N.V., Chandler-Horowitz, D., and Jonker, B.T., J. Appl. Phys. 76, 514 (1994).
[11] Kim, Y.-D., Klein, M.V., Ren, S.F., Chang, Y.C., Luo, H., Samarth, N., and Furdyna, J.K., Phys. Rev. B 49, 7262 (1994).
[12] Collins, R.W. and Vedam, K. in Encyclopedia of Applied Physics, Vol. 12 (VCH, New York, 1995) p. 285.

Spectroellipsometry Studies of Znl-x.cdxSe: From Optical Functions to Heterostructure Characterization

  • Joungchel Lee (a1), Byungyou Hong (a1), J. S. Burnham (a1), R. W. Collins (a1), F. Flack (a2) and N. Samarth (a2)...

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