Hostname: page-component-77c89778f8-fv566 Total loading time: 0 Render date: 2024-07-16T15:05:09.815Z Has data issue: false hasContentIssue false

Soft X‐Ray Studies of Y‐Ba‐Cu‐O Thin Films Prepared by Laser Ablation

Published online by Cambridge University Press:  28 February 2011

A. Krol
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
C.J. Sher
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
D.R. Storch
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
L.W. Song
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
Y.H. Kao
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
S. Witanachi
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
Y.Z. Zhu
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
S. Patel
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
D.T. Shaw
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
G.C. Smith
Affiliation:
Brookhaven National Laboratory, Instrumentation Division, Upton, NY 11973
Get access

Abstract

Angular variation of x‐ray fluorescence due to oxygen atoms in high‐T Y‐Ba‐Cu‐O thin films is measured for the first time by using a new parallel plate avalanche chamber. This technique allows the possibility of nondestructive probing of the depth‐profile of oxygen atoms in the superconducting materials. Our preliminary results indicate that the near surface region of the Y‐Ba‐Cu‐O film may contain an oxygen‐depleted layer of thickness around 20 nm.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Krol, A., Sher, C.J., Ming, Z.H., Lin, C.S., Song, L.W., Kao, Y.H., Smith, G.C., Zhu, Y.Z. and Shaw, D.T., Proc. Third Buffalo Conference on Superconductivity, in press.Google Scholar
2 Smith, G.C., Krol, A. and Kao, Y.H., preprint.Google Scholar
3 Shaw, D.T. et al., preprint.Google Scholar
4 Krol, A., Sher, C.J. and Kao, Y.H., Phys. Rev. B 38 (1988) 8579.Google Scholar
5 Krol, A., Lin, C.S., Sher, C.J., Ming, Z.H., Kao, Y.H., Chen, C.T., Sette, F., Ma, Y., Smith, G.C., Zhu, Y.Z. and Shaw, D.T., preprint.Google Scholar