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Single-state electronic structure measurements using time-resolved x-ray laser induced photoelectron spectroscopy

Published online by Cambridge University Press:  01 February 2011

A. J. Nelson ,
J. Dunn ,
T. van Buuren  and
J. Hunter
A. J. Nelson
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94551
J. Dunn
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94551
T. van Buuren
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94551
J. Hunter
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94551
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Abstract

We demonstrate single-shot x-ray laser induced time-of-flight photoelectron spectroscopy on semiconductor and metal surfaces with picosecond time resolution. The LLNL COMET compact tabletop x-ray laser source provides the necessary high photon flux (>1012/pulse), monochromaticity, picosecond pulse duration, and coherence for probing ultrafast changes in the chemical and electronic structure of these materials. Static valence band and shallow core-level photoemission spectra are presented for ambient temperature Ge(100) and polycrystalline Cu foils. Surface contamination was removed by UV ozone cleaning prior to analysis. In addition, the ultrafast nature of this technique lends itself to true single-state measurements of shocked and heated materials. Time-resolved electron time-of-flight photoemission results for ultra-thin Cu will be presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 840: Symposium Q – Neutron and X-Ray Scattering as Probes of Multiscale Phenomena , 2004 , Q4.6
Copyright
Copyright © Materials Research Society 2005

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References

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