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Simulation and Processing of High Resolution Images of Defects and Interfaces in Superconducting YBa2Cu3O7

Published online by Cambridge University Press:  28 February 2011

H. W. Zandbergen ,
R. Gronsky ,
K. Wang  and
G. Thomas
H. W. Zandbergen
Affiliation:
National Center for Electron Microscopy, and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
R. Gronsky
Affiliation:
National Center for Electron Microscopy, and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
K. Wang
Affiliation:
National Center for Electron Microscopy, and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
G. Thomas
Affiliation:
National Center for Electron Microscopy, and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
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Extract

The superconducting performance, in particular the critical current, of polycrystalline YBa2Cu3O7 will depend strongly on the structure of grain boundaries and the nature and number of defects in the microstructure. To characterize the atomic structure of defects and grain boundaries in these materials, a high resolution electron microscopy study has been initiated. Emphasis has been placed on the technique of phase contrast imaging with corresponding computer simulation and processing for optimum interpretation of results.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 99: Symposium AA – High-Temperature Superconductors , 1987 , 553
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

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