Hostname: page-component-84b7d79bbc-c654p Total loading time: 0 Render date: 2024-07-25T06:13:23.516Z Has data issue: false hasContentIssue false

Silver Nanocluster Formation In Implanted Silica

Published online by Cambridge University Press:  10 February 2011

G. Mariotto
Affiliation:
Istituto Nazionale per la Fisica della Materia and Dipartimento di Fisica, UniversitA di Trento, 38050 Povo, TN, Italy
F. L Freire Jr
Affiliation:
Departamento de Fisica, PUC-Rio, Rio de Janeiro, 22452-970, RI, Brazil
Get access

Abstract

Samples of fused silica were implanted at room temperature with 300 keV-Ag+ for doses ranging from 0.8×1016 to 14×1016 ions/cm2. A multi-technique approach including Rutherford backscattering spectrometry (RBS), x-ray diffraction (XRD), optical absorption and Raman scattering spectroscopies has been used to characterize silver precipitate. The Ag-depth profiles of samples implanted with doses higher than 6×1016 Ag+/cm2 show a bi-modal distribution, with the appearance of a secondary maximum near the surface. XRD spectra indicated the formation of silver nanocrystals of ∼10 nm in size within the heavily implanted samples. Optical absorption has been used to monitor the effects of ion doses on the optical properties of the metal clusters in the UV-Vis region. A single broad absorption band, due to surface plasmon resonance, is peaked at about 400 nm for low implantation doses. For doses higher than 4.3×1016 Ag+/cm2, a second broad band originates at higher wavelengths, peaking at 625 nm for the highest dose. The evolution of optical spectra is tentatively discussed in terms of the formation of silver particle aggregates with no longer spherical shape. An estimate of the mean size of silver nanoclusters of about 5.5 nm is obtained from low-frequency Raman scattering due to acoustic vibrations localized at the cluster surface. The discrepancies in the metal particle size obtained from XRD and Raman scattering measurements are discussed with respect to optical absorption data.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Buchal, Ch., Withrow, S.P., White, C.W. and Poker, D.B., Annu. Rev. Sci. 24, 125 (1994).Google Scholar
2. White, C.W., Boudai, J.D., Zhu, J.G., Withrow, S.P., Hembree, D.M., Henderson, D.O., Ueda, A., Tung, Y.S. and Mu, R., Mat. Res. Soc. Symp. Proc. 396, 377 (1996).Google Scholar
3. Arnold, G.W. and Borders, J. A., J. Appl. Phys. 48, 1488 (1977).Google Scholar
4. Hosono, H., Abe, Y. and Matsunami, N., Appl. Phys. Lett. 60, 2613 (1992).Google Scholar
5. Magruder, R.H. III, Yang, Li, Haglund, R.F., Jr., White, C.W., Yang, Lina, Dorsinville, L. and Alfano, R.R., Appl. Phys. Lett. 62, 1730 (1993).Google Scholar
6. Hosono, H., Fukushima, H., Abe, Y., Weeks, R. A. and Zuhr, R.A., J. Non-Cryst. Solids 143, 157 (1992).Google Scholar
7. Matsunami, N. and Hosono, H., Appl. Phys. Lett. 63, 2050 (1993).Google Scholar
8. Mariotto, G., Montagna, M., Viliani, G., Duval, E., Lefrant, S., Rzepka, E. and Mai, C., Europhys. Lett. 6, 239 (1988).Google Scholar
9. Fuji, M., Nagareda, T., Hayashi, S. and Yamamoto, K., Phys. Rev. B 44, 6243 (1991).Google Scholar
10. Ferrari, M., Gonella, F., Montagna, M. and Tosello, C., J. Appl. Phys. 79, 2055 (1996).Google Scholar
11. Freire, F.L. Jr., Broli, N. and Mariotto, G., Mat. Res. Soc. Sym. Proc. 396, 385 (1996).Google Scholar
12. Lamb, H., Proc. London Math. Soc. 13, 187 (1882).Google Scholar
13. Granquist, C.G., Calander, N. and Hunderi, O., Solid State Commun. 31, 249 (1979).Google Scholar
14. Granquist, C.G. and Hunderi, O., Phys. Rev. B 16, 3513 (1977).Google Scholar
15. Mulder, C.A.M. and Damen, A.A.J.M., J. Non-Cryst. Solids 93, 387 (1987).Google Scholar
16. Mariotto, G.,Montagna, M., Viliani, G., Campostrini, R. and Carturan, G., J.Phys.C 21, L797 (1988).Google Scholar
17. Burman, C. and Lanford, W.A., J. Appl. Phys. 54, 2312 (1983).Google Scholar
18. Mariotto, G. and Freire, F.L. Jr., to be published.Google Scholar
19. Duval, E., Phys. Rev. B 46, 5795 (1992).Google Scholar
20. Montagna, M. and Dusi, R., Phys. Rev. B 52, 10080 (1995).Google Scholar