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Silicon-Based Coatings on Niobium Metal

Published online by Cambridge University Press:  21 February 2011

P. D. Stupik
Affiliation:
Department of Chemistry, Harvard University, Cambridge, MA 02138.
T. R. Jervis
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545.
M. Nastasi
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545.
M. M. Donovan
Affiliation:
Department of Chemistry, Harvard University, Cambridge, MA 02138.
A. R. Barron
Affiliation:
Department of Chemistry, Harvard University, Cambridge, MA 02138.
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Abstract

Silicon coatings on niobium substrates were subjected to thermal, ion beam and laser mixing, and the effectiveness of the different methods for the synthesis of graded interfaces was compared. The resulting metal/silicon interfaces were characterized by X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and Rutherford backscattering (RBS).

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

1. Inouye, H., Niobium, Ed. Stuart, H., AIME 1981, p. 615.Google Scholar
2. Daimer, J. and Fitzer, E., High Temp. High Pressures, 14, 549 (1982).Google Scholar
3. Stupik, P.D., Laibinis, P.E. and Barron, A.R., Industry and University Advanced Materials Conference II, AMI, Colorado (1989) Proceedings, in press.Google Scholar
4. Poate, J.M., Tu, K.N., and Mayer, J.W., Thin Films- Interdiffusion and Reaction. J. Wiley and Sons, London, 1978, p. 360402.Google Scholar
5. Jervis, T.R., Hirvonen, J.P. and Nastasi, M., J. Mater. Res. 3, 1104 (1988).Google Scholar
6. ASTM X-ray powder data file #8–450.Google Scholar