Skip to main content Accessibility help
×
Home

Room-Temperature Life Test of Nichia AlGaN/InGaN/GaN Blue Light Emitting Diodes

  • Marek Osiński (a1), Christopher J. Helms (a2), Niel Berg (a2), Daniel L. Barton (a2) and B. Scott Phillips (a1)...

Abstract

We report on the current status of room-temperature life testing of Nichia NLPB-500 blue light emitting diodes. So far, two tests have been completed. During the first 1000-h test, a constant current of 20 mA was maintained in all devices. During the second 1650 h test, groups of 3 or 4 devices were driven at currents ranging from 20 mA to 70 mA. Very little degradation has been observed in devices driven at normal conditions (20-30 mA), with a noticeable increase in degradation rate above 60 mA.

Copyright

References

Hide All
1 Nakamura, S., Mukai, T., and Senoh, M., Appl. Phys. Lett. 64 (13), pp. 16871689 (1994); S. Nakamura, J. Cryst. Growth 145, pp. 911–917 (1994); S. Nakamura, J. Vac. Sci. & Technol. A13, 705 (1995).
2 Lester, S. D., Ponce, F. A., Craford, M. G., and Steigerwald, D. A., Appl. Phys. Lett. 66 (10), pp. 12491251 (1995).
3 Barton, D. L., Zeller, J., Phillips, B. S., Chiu, P.-C., Askar, S., Lee, D.-S., Osiński, M. and Malloy, K. J., 1995 (33rd Annual) IEEE International Reliability Physics Proc., Las Vegas, NV, 4-6 April 1995, pp. 191-199.

Related content

Powered by UNSILO

Room-Temperature Life Test of Nichia AlGaN/InGaN/GaN Blue Light Emitting Diodes

  • Marek Osiński (a1), Christopher J. Helms (a2), Niel Berg (a2), Daniel L. Barton (a2) and B. Scott Phillips (a1)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed.