Hostname: page-component-7c8c6479df-xxrs7 Total loading time: 0 Render date: 2024-03-28T10:01:00.143Z Has data issue: false hasContentIssue false

The Role of Ballistic, Electronic, and Thermal Processes in Electron Irradiation Damage of Maximum Valence Transition Metal Oxide Surfaces

Published online by Cambridge University Press:  28 February 2011

M. I. Buckett
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
L. D. Marks
Affiliation:
Materials Science & Engineering Dept., Northwestern University, Evanston, IL 60208
Get access

Abstract

Surface-initiated radiation damage processes in a number of the maximum valence transition metal oxides - TiO2, V2O5, WO3, MoO3, Ta2O5, Al2O3, and Nb2O5 - have been investigated by in-situ high resolution electron microscopy under UHV conditions and at incident energies ranging from 3 keV to 300 keV. The relative contributions of ballistic, electronic, and thermal effects are evaluated by a comparison of the observed structural changes and damage rates - made under various experimental conditions of incident electron energy and flux - to theoretical predictions based on thermodynamic and available energy criteria.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kelly, R., Surface Science 100, 85 (1980); Nucl. Inst. & Methods, 182/3, 371 (1981).Google Scholar
2. Fisher, S. B., Radiation Effects 5, 239 (1970).Google Scholar
3. Buckett, M.I., et al., 47th EMSA Proc. 636 (1990).Google Scholar
4. Ai, R., Fan, H. J., Stair, P. C., and Marks, L. D., MRS Proc. Fall 1989 157, 599 (1990).Google Scholar
5. Fan, H. and Marks, L. D., Ultramicroscopy 31, 357 (1989).Google Scholar
6. Marks, L. D., et al., Ultramicroscopy 37, 90 (1991).CrossRefGoogle Scholar
7. Smith, D. J., et al., Ultramicroscopy 37, 169 (1991).Google Scholar
8. Hobbs, L, in Intro. to Analytical Electron Microscopy, New York: Plenum Press (1979) 437.CrossRefGoogle Scholar
9. Sigmund, P., Phys. Rev. 184, 383 (1969).CrossRefGoogle Scholar
10. Naguib, and Kelly, R., Radiation Effects 25, 79 (1975); Radiation Effects 25, 79 (1979).CrossRefGoogle Scholar
11. Kim, K.S., et al., J. Electron Spectrosc. Rel. Phenomena 5, 351 (1974).Google Scholar
12. Zhang, J. P. and Marks, L. D., Surface Science 222, 13 (1989).Google Scholar
13. Buckett, M. I. and Marks, L. D., Surface Science 232, 353 (1990).Google Scholar