Hostname: page-component-848d4c4894-sjtt6 Total loading time: 0 Render date: 2024-06-22T01:02:23.606Z Has data issue: false hasContentIssue false

Recombination Dynamics in Nitride Quantum Boxes and Quantum Wells for Colors Ranging from the UV to the Red

Published online by Cambridge University Press:  17 March 2011

P. Lefebvre
Affiliation:
Groupe d'Etude des Semiconducteurs, CNRS - Université Montpelllier II. Case Courrier 074. 34095 Montpellier Cedex 5, France
A. Morel
Affiliation:
Groupe d'Etude des Semiconducteurs, CNRS - Université Montpelllier II. Case Courrier 074. 34095 Montpellier Cedex 5, France
M. Gallart
Affiliation:
Groupe d'Etude des Semiconducteurs, CNRS - Université Montpelllier II. Case Courrier 074. 34095 Montpellier Cedex 5, France
T. Taliercio
Affiliation:
Groupe d'Etude des Semiconducteurs, CNRS - Université Montpelllier II. Case Courrier 074. 34095 Montpellier Cedex 5, France
B. Gil
Affiliation:
Groupe d'Etude des Semiconducteurs, CNRS - Université Montpelllier II. Case Courrier 074. 34095 Montpellier Cedex 5, France
J. Allègre
Affiliation:
Groupe d'Etude des Semiconducteurs, CNRS - Université Montpelllier II. Case Courrier 074. 34095 Montpellier Cedex 5, France
H. Mathieu
Affiliation:
Groupe d'Etude des Semiconducteurs, CNRS - Université Montpelllier II. Case Courrier 074. 34095 Montpellier Cedex 5, France
N. Grandjean
Affiliation:
Centre de Recherche sur l'Hétéro-Epitaxie et ses Applications, CNRS. Rue Bernard Grégory. 06560 Valbonne, France
B. Damilano
Affiliation:
Centre de Recherche sur l'Hétéro-Epitaxie et ses Applications, CNRS. Rue Bernard Grégory. 06560 Valbonne, France
J. Massies
Affiliation:
Centre de Recherche sur l'Hétéro-Epitaxie et ses Applications, CNRS. Rue Bernard Grégory. 06560 Valbonne, France
Get access

Abstract

Time-resolved photoluminescence experiments at varying temperature are performed on a series of InxGa1−xN/GaN quantum well and quantum box samples of similar compositions (0.15 < x < 0.20). The results are analyzed by using envelope-function calculations of transition energies and oscillator strengths, accounting for internal electric fields. The respective influences of localization and electric fields on radiative and nonradiative lifetimes and on the Stokes shift are deduced. The results indicate that the spatial extension of localization centers is much smaller than the size of the quantum boxes (∼10 × 3 nm, typically). The room-temperature radiative efficiency of both quantum well and quantum box samples is enhanced by replacing the topmost GaN barrier by an AlGaN one.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.The Blue Laser diode” edited by Nakamura, S. and Fasol, G., Springer Berlin (1997)Google Scholar
2.Group III Nitride semiconductor Compounds”, Edited by Gil, B., Clarendon Press, Oxford (1998) ISBN 0-19-850159-5Google Scholar
3. Morkoç, H., in: “Nitride Semiconductors and Devices”, Springer, Heidelberg (1999).Google Scholar
4. Narukawa, Y., Kawakami, Y., Funato, M., Fujita, S., Fujita, S. and Nakamura, S., Appl. Phys. Lett. 70, 981 (1997).Google Scholar
5. Chichibu, S., Azuhata, T., Sota, T. and Nakamura, S., Appl. Phys. Lett. 69, 4188 (1996).Google Scholar
6. O'Donnell, K.P., Martin, R.W. and Middleton, P.G., Phys. Rev. Lett. 82, 237 (1999).Google Scholar
7. Narukawa, Y., Kawakami, Y., Fujita, S. and Nakamura, S., Phys. Rev. B 59, 10283 (1999).Google Scholar
8. Sohmer, A., Off, J., Bolay, H., Härle, V., Syganow, V., Im, J.S., Wagner, V., Adler, F., Hangleiter, A., Dörnen, A., Scholtz, F., Brunner, D., Ambacher, O. and Lakner, H., MRS Internet J. Nitride Semicond. Res. 2, 14 (1997) (http://nsr.mij.mrs.org/2/14/)Google Scholar
9. Cho, Y.-H., Gainer, G.H., Fisher, A.J., Song, J.J., Keller, S., Mishra, U.K. and DenBaars, S.P., Appl. Phys. Lett. 73, 1370 (1998).Google Scholar
10. Cho, Y.-H., Schmidt, T.J., Fisher, A.J., Bidnyk, S., Gainer, G.H., Song, J.J., Keller, S., Mishra, U.K., DenBaars, S.P., Kim, D.S. and Jhe, W., Phys. Stat. Sol (b) 216, 181 (1999).Google Scholar
11. Narukawa, Y., Kawakami, Y., Fujita, S., Fujita, S., Nakamura, S., Phys. Rev. B 55, R1938 (1997).Google Scholar
12. Cohen, E. and Sturge, M.D., Phys. Rev. B 25, 3828 (1982).Google Scholar
13. Andreani, L.C., Tassone, F. and Bassani, F., Solid State Commun. 77, 641 (1991).Google Scholar
14. Bykhovsky, A., Gelmont, B.L. and Shur, M., J. Appl. Phys. 81, 6332 (1997).Google Scholar
15. Bernardini, F. and Fiorentini, V., Phys. Rev. B 57, R9427 (1998)Google Scholar
16. Takeuchi, T., Sota, S., Katsuragawa, M., Komori, M., Takeuchi, H., Amano, H. and Akasaki, I, Jpn. J. Appl. Phys. Part 2, No 4A, Vol. 36, L382 (1997).Google Scholar
17. Wetzel, C., Takeuchi, T., Amano, H. and Akasaki, I., Phys. Rev. B 61, 2159 (2000).Google Scholar
18. Hangleiter, A., Im, J.-S., Kollmer, H., Heppel, S., Off, J. and Scholz, F., MRS Internet J. Nitride Semicond. Res. 3, 15 (1998).Google Scholar
19. Im, J.-S., Kollmer, H., Off, J., Sohmer, A., Scholz, F. and Hangleiter, A., Phys. Rev. B 57, R9435 (1998).Google Scholar
20. Chichibu, S.F., Abare, A.C., Minski, M.S., Keller, S., Fleischer, S.B., Bowers, J.E., Hu, E., Mishra, U.K., Coldren, L.A., DenBaars, S.P. and Sota, T., Appl. Phys. Lett. 73, 2006 (1998).Google Scholar
21. Leroux, M., Grandjean, N., Laügt, M., Massies, J., Gil, B., Lefebvre, P. and Bigenwald, P., Phys. Rev. B 58, R13371 (1998).Google Scholar
22. Lefebvre, P., Allègre, J., Gil, B., Mathieu, H., Bigenwald, P., Grandjean, N., Leroux, M. and Massies, J., Phys. Rev. B 59, 15363 (1999), and references cited therein.Google Scholar
23. Berkowicz, E., Gershoni, D., Bahir, G., Lakin, E., Shilo, D., Zolotoyabko, E., Abare, A.C., DenBaars, S.P. and Coldren, L.A., Phys. Rev. B 61, 10994 (2000).Google Scholar
24. Damilano, B., Grandjean, N., Semond, F., Massies, J. and Leroux, M., Appl. Phys. Lett. 75, 962 (1999).Google Scholar
25. Grandjean, N., Damilano, B., Dalmasso, S., Leroux, M., Laügt, M. and Massies, J., J. Appl. Phys. 86, 3714 (1999)Google Scholar
26. Widmann, F., Simon, J., Daudin, B., Feuillet, G., Rouvière, J.L., Pelekanos, N.T. and Fishman, G., Phys. Rev. B. 58, R15989 (1998).Google Scholar
27. Reshchikov, M. A., Cui, J., Yun, F., Barski, A., Nathan, M. I., Molnar, R. and Morkoç, Hadis, Proc. MRS 2000 Spring Meeting, Mat. Res. Soc. Proceedings edited by Shul, R.J., Ren, F., Marukami, M., and Pletschen, W., ISBN: 1-55899-530-7 (in press)Google Scholar
28. Damilano, B., Grandjean, N., Massies, J., Siozade, L. and Leymarie, J., Appl. Phys. Lett. 77, 1268 (2000).Google Scholar
29. O'Donnell, K.P., Martin, R.W., Pereira, S., Bangura, A., White, M.E., Stricht, W. Van der and Jacobs, K., Phys. Stat. Sol. (b) 216, 141 (1999).Google Scholar
30. Leroux, M. and Gil, B., in “Properties, Proocessing and Applications of GaN and Related Semiconductors”, Emis Datareviews series. Edited by Edgar, J.H., Strite, S. Akasaki, I., Amano, H. and Wetzel, C.. Published by INSPEC, London, UK. p. 117 (1999).Google Scholar
31. Chuang, S.L. and Chang, C.S., Phys. Rev. B 54, 2491 (1996).Google Scholar
32. Walle, C.G. Van de, McCluskey, M.D., Master, C.P., Romano, L.T. and Johnson, N.M., Materials Science and Engineering B 59, 274 (1999).Google Scholar
33. Takeuchi, T., Takeuchi, H., Sota, S., Sakai, H., Amano, H. and Akasaki, I., Jpn. J. Appl. Phys. 36, L177 (1997).Google Scholar
34. Bastard, G.Wave mechanics applied to semiconductor heterostructuresLes Editions de Physique Paris, (1988).Google Scholar
35. Ibbetson, J.P., Fini, P.T., Ness, K.D., DenBaars, S.P., Speck, J.S. and Mishra, U.K., Appl. Phys. Lett. 77, 250 (2000).Google Scholar
36. Zunger, A., Phys. Stat. Sol. (b) 216, 117 (1999).Google Scholar