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Raman Spectroscopic Analysis of p-doped Bridged InP Nanowire

Published online by Cambridge University Press:  01 February 2011

Ataur Sarkar
Affiliation:
mrsarkar@ucdavis.edu, University of California, Electrical and Computer Engineering, One Shields Avenue, Davis, CA, 95616, United States, 530-754-2257
M. Saif Islam
Affiliation:
saif@ece.ucdavis.edu, University of California, Electrical and Computer Engineering, One Shields Avenue, Davis, CA, 95616, United States
Sungsoo Yi
Affiliation:
sungsoo.yi@philips.com, Currently at Advanced Labroratories, Philips Lumileds Lighting Company, Molecular Technology Laboratory, Agilent Technologies, San Jose, CA, 95131, United States
A. Alec Talin
Affiliation:
aatalin@sandia.gov, Sandia National Laboratories, P.O. Box 969, Livermore, CA, 94551, United States
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Abstract

Raman spectroscopy was performed on magnesium (Mg) doped InP nanowires bridged between single crystal vertical silicon electrodes using a green laser (λ∼ 532 nm). First order TO-phonon and LO phonon-plasmon peaks observed at 305 cm−1 and 345 cm−1, respectively, are consistent with those for bulk single crystal InP. Misorientation of the nanowires is found to influence the TO and LO peak intensities. Bottom broadening up to ∼20 cm−1 of the TO peak due to the energy dispersion in the shifted Stokes spectrum is observed in long (∼6 μm) nanowires. Raman measurements indicated a trace of uncatalyzed InP on the insulating silicon oxide substrate and was verified through the electrical measurements of leakage currents before and after the nanowire growth. Initial investigation reveals that Raman spectroscopy can be a very useful in the study of nanowire heterostructures.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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References

REFERENCES

[1] Raman, C. V., “A change of wave-length in light scattering,” Nature, vol. 121, pp. 619–619, Jan-Jun 1928.Google Scholar
[2] Ball, D. W., “Theory of Raman spectroscopy,” Spectroscopy, vol. 16, no. 11, Nov 2001.Google Scholar
[3] Ball, D. W., “Rayleigh and Raman scattering,” Spectroscopy, vol. 16, no. 2, Feb 2001.Google Scholar
[4] Guo, X. D., Li, R. X., Hang, Y., Xu, Z. Z., Yu, B. K., Ma, H. L., and Sun, X. W., “Raman spectroscopy and luminescent properties of ZnO nanostructures fabricated by femtosecond laser pulses,” Materials Letters, vol. 61, pp. 45834586, Sep 2007.Google Scholar
[5] Olego, D. and Cardona, M., “Raman-scattering by 2 LO-Phonons near -Gamma in GaAs,” Solid State Communications, vol. 39, pp. 10711075, 1981.Google Scholar
[6] Zeiri, L., Patla, I., Acharya, S., Golan, Y., and Efrima, S., “Raman spectroscopy of ultranarrow CdS nanostructures,” Journal of Physical Chemistry C, vol. 111, pp. 1184311848, Aug 16 2007.Google Scholar
[7] Cusco, R., Artus, L., Ibanez, J., Blanco, N., Gonzalez-Diaz, G., Rahman, M., and Long, A. R., “Comparison of Raman-scattering and Shubnikov-de Haas measurements to determine charge density in doped semiconductors,” Journal of Applied Physics, vol. 88, pp. 65676570, Dec 1 2000.Google Scholar
[8] Gu, P., Tani, M., Sakai, K., and Yang, T. R., “Detection of terahertz radiation from longitudinal optical phonon-plasmon coupling modes in InSb film using an ultrabroadband photoconductive antenna,” Applied Physics Letters, vol. 77, pp. 17981800, Sep 18 2000.Google Scholar
[9] Piscanec, S., Cantoro, M., Ferrari, A. C., Zapien, J. A., Lifshitz, Y., Lee, S. T., Hofmann, S., and Robertson, J., “Raman spectroscopy of silicon nanowires,” Physical Review B, vol. 68, pp. -, Dec 2003.Google Scholar
[10] Gupta, R., Xiong, Q., Mahan, G. D., and Eklund, P. C., “Surface optical phonions in gallium phosphide nanowires,” Nano Letters, vol. 3, pp. 17451750, Dec 2003.Google Scholar
[11] Gupta, R., Xiong, Q., Adu, C. K., Kim, U. J., and Eklund, P. C., “Laser-induced Fano resonance scattering in silicon nanowires,” Nano Letters, vol. 3, pp. 627631, May 2003.Google Scholar
[12] Bonse, J., Wrobel, J. M., Brzezinka, K. W., Esser, N., and Kautek, W., “Femtosecond laser irradiation of indium phosphide in air: Raman spectroscopic and atomic force microscopic investigations,” Applied Surface Science, vol. 202, pp. 272282, Dec 30 2002.Google Scholar
[13] Zeiri, L. and Efrima, S., “Surface-enhanced Raman scattering (SERS) of microorganisms,” Israel Journal of Chemistry, vol. 46, pp. 337346, 2006.Google Scholar
[14] Olego, D. and Cardona, M., “Raman scattering by coupled LO-phonon-plasmon modes and forbidden TO-phonon Raman scattering in heavily doped p-type GaAs,” Physical Review B, vol. 24, pp. 72177232, December 15 1981.Google Scholar
[15] Islam, M. S., Sharma, S., Kamins, T. I., and Williams, R. S., “A novel interconnection technique for manufacturing nanowire devices,” Applied Physics A-Materials Science & Processing, vol. 80, pp. 11331140, Mar 2005.Google Scholar