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Quasicrystalline Films and their Amorphous Precursors

Published online by Cambridge University Press:  17 March 2011

Roland Haberkern
Affiliation:
Technische Universität Chemnitz, Institut für Physik, 09107 Chemnitz, GERMANY
Jose Barzola-Quiquia
Affiliation:
Technische Universität Chemnitz, Institut für Physik, 09107 Chemnitz, GERMANY
Caroline Madel
Affiliation:
Technische Universität Chemnitz, Institut für Physik, 09107 Chemnitz, GERMANY
Peter Häussler
Affiliation:
Technische Universität Chemnitz, Institut für Physik, 09107 Chemnitz, GERMANY
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Abstract

Binary and ternary aluminum based amorphous precursor films have been prepared by the sequential-flash evaporation technique in the case of Al-Mn, Al-Fe, Al-Cu-Fe and Al-Pd-Mn and by co-sputtering in the case of Al-Pd-Re. For well adjusted compositions and an appropriate heat treatment films can be transformed into polycrystalline single phased quasicrystals for all of the systems mentioned above. The transition can be monitored by in situ measurements of electronic transport properties. The structure factors as a function of composition and annealing state has been measured by electron diffraction. They show a unique behavior if the composition is chosen to that of the related quasicrystal. For high annealing states of the amorphous phase the structure factor becomes more intense at the peak positions of the following i-phase. This is interpreted as a unique radial near- and medium-range order of both the i-phase and its amorphous precursor. The final transformation into the quasicrystal is sharp for Al-Cu-Fe and is broad in the case of Al-Pd-Mn and Al-Pd-Re. The transport properties of the resulting single phased films are similar to that of the related bulk samples and allow systematic studies as a function of composition. Some of the i-Al-Pd-Re films are on the insulating side of the metal-insulator transition.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

1. Massiani, Y., Yaazza, S. Ait and Dubois, J.-M., in Proceedings of the 5th Int. Conf. on Quasicrystals, edited by Janot, C., Mosseri, R. (World Scientific, 1996), 790.Google Scholar
2. Sordelet, D.J., Kramer, M.J., Anderso, I.E. and Besser, M.F., in Proceedings of the 5th Int. Conf. on Quasicrystals, edited by Janot, C., Mosseri, R., (World Scientific, 1996), 778.Google Scholar
3. Sánchez, A., Blas, F.J. García de, Algaba, J.M., Alvarez, J., Vallés, P., García-Poggio, M.C., Agüero, A., MRS-Proceedings Vol. 553, Quasicrystals; Dubois, J. M., Thiel, P.A., Tsai, A.-P., Urban, K., eds., 447 (1999).Google Scholar
4. Klein, T., Symko, O.G., Appl Phys. Lett. 64, 431 (1994).Google Scholar
5. Haberkern, R., Roth, C., Häussler, P., MRS-Proceedings Vol. 553, Quasicrystals; Dubois, J. M., Thiel, P.A., Tsai, A.-P., Urban, K., eds., 13 (1999).Google Scholar
6. Frank, F.C., Proc. R. Soc. London, Ser. A 215, 43 (1952).Google Scholar
7. Simonet, V., Hippert, F., Klein, H., Audier, M., Bellisent, R., Fischer, H., Murani, A.P., Bournier, D., Phys. Rev. B 58, 6273 (1998).Google Scholar
8. Maret, M., Pasturel, A., Senillou, C., Dubois, J.M., Chieux, P., J. Phys. (France) 50, 295 (1989).Google Scholar
9. Häussler, P., Metals, Glassy III, Topics in Appl. Phys. 72, Springer, 163 (1994).Google Scholar
10. Waseda, Y., Metals, Liquid, Evans, R., Greenwood, D.A., eds., Inst. Phys, Conf. Ser. No. 30, 230 (1977).Google Scholar
11. Haberkern, R., Roth, C., Knöfler, R., Zavaliche, F., Häussler, P.. Proceedings of the 6th International Conference on Quasicrystals, Takeuchi, S., Fujiwara, T eds., World Scientific, 643 (1998).Google Scholar
12. Roth, C., Schwalbe, G., Knöfler, R., Zavaliche, F., Madel, O., Haberkern, R., Häussler, P., J. of Non-Cryst. Solids 252, 869 (1999).Google Scholar
13. Haberkern, R., Khedhri, K., Madel, C., Häussler, P.. Mat. Science and Eng. A 294–296, 475 (2000).Google Scholar
14. Häussler, P., Nowak, H., Haberkern, R., Mat. Science and Eng. A 294296 (2000), in press.Google Scholar
15. Mayou, D., Berger, C., Cyrot-Lackmann, F., Klein, T., Lanco, P., Phys. Rev. Lett., 70, 3915 (1993).Google Scholar
16. Janot, C., J. Phys.: Condens. Matter, 9, 1493 (1997).Google Scholar
17. Krajč, M., Hafner, J., Phys. Rev. B, 59, 8347 (1999).Google Scholar
18. Landauro, C., Solbrig, H.. Mat. Science and Eng. A 294296, in press (2000).Google Scholar
19. Escudero, R., Lasjaunias, J.C., Calvayrac, Y., Boudard, M., J. Phys.: Condens. Matter, 11, 383 (1999).Google Scholar
20. Dolinšek, J., Klanjšek, M., Apih, T., Smontara, A., Lasjaunias, J.C., Dubois, J.M., Poon, S.J., Phys. Rev. B, 62, 8862 (2000).Google Scholar
21. Kroha, H., Mat. Science and Eng. A 294296 (2000), in press.Google Scholar
22. Guo, Q., Poon, S.J.; Phys. Rev. B 54, 12793 (1996).Google Scholar
23. Ahlgren, M., Gignoux, C., Rodmar, M., Berger, C. and Rapp, Ö.; Phys. Rev. B 55, R11 915 (1997).Google Scholar
24. Delahaye, J., Brison, J.P. and Berger, C.; Phys. Rev. Lett. 81, 4204 (1998).Google Scholar
25. Rodmar, M., Zavaliche, F., Poon, S. J., Rapp, O., Phys. Rev. B 60, 10807 (1999).Google Scholar
26. Beeli, C., Soltmann, C., Poon, S.J., Häussler, D., Mat. Science and Eng. A 294296 (2000), in press.Google Scholar
27. Neuhold, G., Barman, S.R., Horn, K., Theis, W., Ebert, Ph., Urban, K., Phys. Rev. B, 56, 734 (1998)Google Scholar
28. Rosenbaum, R., Haberkern, R., Häussler, P., Palm, E., Murphy, T., Hannahs, S., Brandt, B.; J. Phys.: Condens. Matter 12, 9735 (2000).Google Scholar