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Pt-SiO2 Granular Metals for Cryogenic Thermometry in High Magnetic Fields

Published online by Cambridge University Press:  28 February 2011

Elida De Obaldia ,
T.D. Moustakas ,
Jeff Hettengier  and
J.S. Brooks
Elida De Obaldia
Affiliation:
Boston University Department of Physics, Boston, Massachusetts 02215
T.D. Moustakas
Affiliation:
Boston University Department of Physics, Boston, Massachusetts 02215
Jeff Hettengier
Affiliation:
Boston University Department of Physics, Boston, Massachusetts 02215
J.S. Brooks
Affiliation:
Boston University Department of Physics, Boston, Massachusetts 02215
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Abstract

Pt-SiO2 granular metal films were produced by RF diode sputtering and characterized as thermistors for cryogenic temperature measurements at high magnetic fields. The devices were found to have high sensitivity and small magnetoresistance. This, together with ease of fabrication and stability, makes such thermistor useful candidates for cryogenic thermometry.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 195: Symposium S – Physical Phenomena in Granular Materials , 1990 , 659
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

[1] Richardson, R. and Smith, E., Techniques in Condensed Matter Physics at Low Temperatures (Addison- Wesley, Boston MA 1988)Google Scholar
[2] Gershenfeld, N.A., VanCleve, J.E., Webb, W.W., Ficher, H.E., Fortune, N.A., Brooks, J.S., and Grat, M.J., J. Appl. Phys. 64, 4760 (1988)Google Scholar
[3] Abeles, B., Sheng, P., Coutts, M.D., and Arie, Y., Adv. Phys. 24(3), 407 (1975)Google Scholar
[4] Hanak, J.J., Lehmann, H.W., and Wehner, R.K., J. appl. Phys., 43, 1666 (1972)Google Scholar
[5] Hanak, J.-J., and Bolker, B.F.T., J. appl. Phys., 44, 5142 (1973)Google Scholar