Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-26T05:05:39.264Z Has data issue: false hasContentIssue false

Properties of ZnO Thin Films Deposited by Spray Pyrolysis and Magnetron Sputtering

Published online by Cambridge University Press:  17 March 2011

Patrícia Nunes
Affiliation:
Department of Materials Science/CENIMAT, Faculty of Sciences and Technology, New University of Lisbon and CEMOP-UNINOVA, 2825-114 Caparica, Portugal
Elvira Fortunato
Affiliation:
Department of Materials Science/CENIMAT, Faculty of Sciences and Technology, New University of Lisbon and CEMOP-UNINOVA, 2825-114 Caparica, Portugal
Rodrigo Martins
Affiliation:
Department of Materials Science/CENIMAT, Faculty of Sciences and Technology, New University of Lisbon and CEMOP-UNINOVA, 2825-114 Caparica, Portugal
Get access

Abstract

In this work we present a study of the properties of ZnO thin films produced by spray pyrolysis and r.f. magnetron sputtering. Before the annealing treatment the properties of the films are very similar, which means that the films produced by both techniques could be used on optoelectronic devices. However spray pyrolysis is a more simple and cheap technique than sputtering, but with this last technique the thin films exhibit a higher uniformity.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Belghit, K., Subhan, M.A., Rulhe, U., Duchemin, S. and Bougnot, J., 10th European Photovoltaic Solar Energy Conference, 613 (1991).Google Scholar
[2] Lan, J. and Kanicki, J., Mat. Res. Soc. Symp. 424, 347 (1997).Google Scholar
[3] Chopra, K.L., Major, S., Panday, D.K., Thin Solid Films 102,1 (1983).Google Scholar
[4] Michel, H.J., Leiste, H., Schierbaum, K.D., Halbritter, J., Appl. Surfac. Scinc. 126, 57 (1998).Google Scholar
[5] Chen, R.T., Robinson, D., Appl. Phys. Lett. 60, 1541 (1992).Google Scholar
[6] Joshi, R.N., Singh, V.P., McClure, J.C., Thin Solid Films 257, 32 (1995).Google Scholar
[7] Gottlieb, B., Koropecki, R., Arce, R., Crisalle, R., Ferron, J., Thin Solid Films 199, 13 (1991).Google Scholar
[8] Nunes, P., Malik, A., Fernandes, B., Fortunato, E., Vilarinho, P., Martins, R., Vaccum 52, 45 (1999).Google Scholar
[9] Chernets, A.N., Kenigsberg, N.L., Thin Solid Films 18, 247 (1973).Google Scholar
[10] Poschenriedes, M., Brehme, S., Fenske, F., Fuhs, W., Nebauer, E., Selle, B., Siber, I., 10th International Conference of Thin Films 5, 10 (1996).Google Scholar
[11] Dutta, A., Basu, S., Mater. Chem. Phys. 34, (1993).Google Scholar
[12] Lefdil, M. Abd, Messaoudi, C., Cadene, M., 13th Europeun Photovoltaic Solar Energy Conference, 2092 (1995).Google Scholar
[13] Major, S., Banerjee, A., Chopra, K.L., Thin Solid Films 154, 41 (1984).Google Scholar
[14] Gordon, R.G., Mat. Res. Soc. Symp. 426, 419 (1996).Google Scholar