Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-25T20:55:26.101Z Has data issue: false hasContentIssue false

The Problem of the Top Cell for the Micromorph Tandem

Published online by Cambridge University Press:  15 February 2011

Rainer Platz
Affiliation:
Institut de Microtechnique, Université de Neuchâtel, Rue, A.-L.Breguet 2, CH-2000 Neuchâtel, Switzerland, platz@imt.unine.ch;http://www-nucromorph.unine.ch
J. Meier
Affiliation:
Institut de Microtechnique, Université de Neuchâtel, Rue, A.-L.Breguet 2, CH-2000 Neuchâtel, Switzerland, platz@imt.unine.ch;http://www-nucromorph.unine.ch
D. Fischer
Affiliation:
Institut de Microtechnique, Université de Neuchâtel, Rue, A.-L.Breguet 2, CH-2000 Neuchâtel, Switzerland, platz@imt.unine.ch;http://www-nucromorph.unine.ch
S. Dubail
Affiliation:
Institut de Microtechnique, Université de Neuchâtel, Rue, A.-L.Breguet 2, CH-2000 Neuchâtel, Switzerland, platz@imt.unine.ch;http://www-nucromorph.unine.ch
A. Shah
Affiliation:
Institut de Microtechnique, Université de Neuchâtel, Rue, A.-L.Breguet 2, CH-2000 Neuchâtel, Switzerland, platz@imt.unine.ch;http://www-nucromorph.unine.ch
Get access

Abstract

A detailed study of the influence of different materials for the amorphous top cell on the stabilized efficiency of amorphous silicon/microcrystalline silicon (”micromorph”) tandem cells is presented. The authors investigate different amorphous i-layer materials which are applied in cells with varying thicknesses. It is shown that it is preferable to optimize the top cell in order to obtain a high current rather than a high voltage.

A simple optical and electrical model is presented which allows one to predict the optimum optical bandgap of the i-layer material of the top cell and to determine its optimum thickness for maximum stabilized efficiency. By means of this model it is shown that the optimum top cell for a total cell current of 26 mA/cm2 should contain an about 2500 Å thick i-layer with an optical gap Eo4 ≃ 1.8 eV. The model furthermore shows that it is desirable to obtain slightly bottom-limited conditions after degradation in order to maximize the output power.

A stabilized efficiency of 10.7 % for a micromorph tandem cell has been confirmed by an independent measurement (FhG-ISE). Another such cell yields a stabilized efficiency of 11.2 % as measured in our laboratory.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Meier, J., Flückiger, R., Keppner, H. and Shah, A., Appl. Phys. Lett. 65 (1994) 860.Google Scholar
[2] Meier, J., Torres, P., Platz, R., Dubail, S., Kroll, U., Anna Selvan, J.A., Pellaton Vaucher, N., Hof, C., Fischer, D., Keppner, H., Shah, A., Ufert, K.-D., Giannoulès, P., Koehler, J., MRS Symp. Proc. 420 (1996) 3.Google Scholar
[3] Meier, J., Dubail, S., Platz, R., Torres, P., Kroll, U., Anna Selvan, J.A., Pellaton Vaucher, N., Hof, C., Fischer, D., Keppner, H., Flückiger, R., Shah, A., Shklover, V., Ufert, K.-D., Proc. PVSEC-9, Miyazaki 1996, to be published.Google Scholar
[4] Platz, R., Fischer, D., Hof, C., Dubail, S., Meier, J., Kroll, U. and Shah, A., MRS Symp. Proc. 420 (1996) 51. Google Scholar
[5] Platz, R., Fischer, D., Dubail, S. and Shah, A., Solar Energy Materials and Solar Cells, to be published.Google Scholar
[6] Guha, S., Proc. 25th IEEE PVSC (1996) 1.Google Scholar
[7] Rech, B., Wieder, S., Siebke, F., Beneking, C. and Wagner, H., MRS Symp. Proc. 420 (1996) 33.Google Scholar
[8] Beck, N., Meier, J., Fric, J., Remes, Z., Poruba, A., Flückiger, R., Pohl, J., Shah, A., Vanecek, M., J.Non-Cryst. Solids 198–200 (1996) 903.Google Scholar
[9] Nishikuni, M., Takahama, T., Okamoto, S., Ninomiya, K., Nishiwaki, H., Tsuda, S., Takeoka, A., Ohnishi, M., Nakano, S. and Kuwano, Y., Progr. in Photovoltaics 2 (1994) 211.Google Scholar
[10] Xu, X., Yang, J.C. and Guha, S., Proc. 23rd IEEE PVSC (1993) 971.Google Scholar