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Portable P-I-N CdZnte Gamma-Ray Spectroscopy System

Published online by Cambridge University Press:  10 February 2011

R. Sudharsanan ,
C. Stenstrom ,
G. Vakerlis ,
J. Pantazis ,
A. Huber ,
R. Redus  and
V. T. Jordanov
R. Sudharsanan
Affiliation:
Spire Corporation, One Patriots Park, Bedford, MA 01730, Sudan@Spirecorp.com
C. Stenstrom
Affiliation:
Spire Corporation, One Patriots Park, Bedford, MA 01730, Sudan@Spirecorp.com
G. Vakerlis
Affiliation:
Spire Corporation, One Patriots Park, Bedford, MA 01730, Sudan@Spirecorp.com
J. Pantazis
Affiliation:
AMPTEK Inc., Bedford, MA 01730
A. Huber
Affiliation:
AMPTEK Inc., Bedford, MA 01730
R. Redus
Affiliation:
AMPTEK Inc., Bedford, MA 01730
V. T. Jordanov
Affiliation:
AMPTEK Inc., Bedford, MA 01730
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Abstract

A portable Gamma-Ray Spectroscopy system has been designed and tested for identification of nuclear materials in the field. A P-I-N CdZnTe detector was developed to minimize the leakage current and to improve energy resolution. The detector has a sensitive volume of 200 mm3 and has been constructed with novel heterojunction contacts. Thermoelectric cooling is used to reduce leakage currents in the detector element and the input thermal noise to the FET. Risetime discrimination is used to offset the negative effects of incomplete charge collection. The detector probe is connected to a single unit comprised of detector electronics, an MCA and a portable computer, all operated from battery power. Results from testing with laboratory radioisotopic sources are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 487: Symposium I – Semiconductors for Room-Temperature Radiation II , 1997 , 217
Copyright
Copyright © Materials Research Society 1998

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References

1.. Lavietes, A.D., McQuaid, J.H. and Ruhter, W.D., IEEE Transactions on Nuclear Science, 42, 634 (1996).Google Scholar
2. Lavietes, A.D., McQuaid, J.H. and Paulus, T.J., Nuclear Instruments and Methods in Physics Research, 380, 401 (1996).Google Scholar
3. Sudharsanan, R., Stenstrom, C. C., Bennett, P. and Vakerlis, G., Presented at the 1997 MRS Fall Meeting, Boston, MA.Google Scholar
4. Sudharsanan, R., Vakerlis, G.D. and Karam, N.H., J. Electron. Mat.Vol. 26, No. 6, 1997.Google Scholar
5. Pantazis, J., Huber, A., Okun, P., Squillante, M.R., Waer, P., Entine, G., IEEE Trans. Nucl. Sci. NS–41, 1004 (1994).Google Scholar
6. Huber, A.C., Pantazis, J.A., Jordanov, V.T., Nucl. Instrum. Meth. B 99, 665 (1995).Google Scholar
7. Akutagawa, W., Zanio, K., J. Appl. Phys. 40, 3838 (1969).Google Scholar
8. Richter, M., Siffert, P., Nucl. Instrum. Meth. A 322, 529 (1992).Google Scholar
9. Redus, R., Squillante, M., Lund, J., Nucl. Instrum. Meth. A 380, 312 (1996).Google Scholar
10. Jordanov, V.T., Pantazis, J.A., Huber, A.C., Nucl. Instrum. Meth. A 380, 353 (1996)Google Scholar