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Polarized Photoluminescence Study on AlGaN of AlGaN/GaN Heterostructure

  • Sachio Kitagawa (a1), Kenichi kosaka (a2), Tadayoshi Tuchiya (a3), Akira Suzuki (a4), Tsutomu Araki (a5) and Yasushi Nanishi (a6)...

Abstract

Optical properties of tensile strained AlxGa1-xN films of AlxGa1-xN/GaN heterostructures grown on sapphire were investigated by using polarization-resolved photoluminescence spectroscopy. Emissions from AlxGa1-xN with polarization of E//c and E⊥c were obtained at different peak energies. The energy separation of these emissions with polarization was increased linearly with the increase in Al mole fraction of the strained AlxGa1-xN, indicating that the energy separation was due to biaxial strain in the tensile strained AlxGa1-xN.

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Keywords

Polarized Photoluminescence Study on AlGaN of AlGaN/GaN Heterostructure

  • Sachio Kitagawa (a1), Kenichi kosaka (a2), Tadayoshi Tuchiya (a3), Akira Suzuki (a4), Tsutomu Araki (a5) and Yasushi Nanishi (a6)...

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