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Polarized Neutron Glancing-Angle Diffraction Study of Magnetic Structure at the Y/Gd(0001) Interface

Published online by Cambridge University Press:  22 February 2011

J.F. Ankner
Affiliation:
Missouri University Research Reactor, Columbia, MO 65211 **National Institute of Standards and Technology, Reactor Radiation Division, Gaithersburg, MD 20899
P.D. Gallagher
Affiliation:
Missouri University Research Reactor, Columbia, MO 65211 **National Institute of Standards and Technology, Reactor Radiation Division, Gaithersburg, MD 20899
A. Schreyer
Affiliation:
Ruhr University Bochum, Department of Physics and Astronomy, D-44760 Bochum, Germany
H. Zhang
Affiliation:
Missouri University Research Reactor, Columbia, MO 65211 **National Institute of Standards and Technology, Reactor Radiation Division, Gaithersburg, MD 20899
C.F. Majkrzak
Affiliation:
Missouri University Research Reactor, Columbia, MO 65211 **National Institute of Standards and Technology, Reactor Radiation Division, Gaithersburg, MD 20899
S.K. Satija
Affiliation:
Missouri University Research Reactor, Columbia, MO 65211 **National Institute of Standards and Technology, Reactor Radiation Division, Gaithersburg, MD 20899
H. Zabel
Affiliation:
Ruhr University Bochum, Department of Physics and Astronomy, D-44760 Bochum, Germany
A. Matheny
Affiliation:
University of Illinois, Department of Physics, Urbana, IL 61801
C.P. Flynn
Affiliation:
University of Illinois, Department of Physics, Urbana, IL 61801
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Abstract

By exciting diffraction in the Laue geometry by specularly reflected beams, penetrating x-rays and neutrons can be used to probe surface and interfacial atomic structure. We present the first such measurement utilizing polarized neutrons with both incident- and exit-angle resolution. We have observed the evolution of magnetic order by monitoring the in-plane (1010) Bragg peak from an epitaxially grown film consisting of 150 Å Y(0001) on 5000 Å Gd(0001). Magnetic scattering increases as the film is cooled from the Gd bulk Curie temperature (293K) to 100 K. The gross features of the data can be captured by a simple two-layer model, but sufficient disagreement remains that one may yet hope to extract non-trivial structure at the Y/Gd interface.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1 Dosch, H., Critical Phenomena at Surfaces and Interfaces, Evanescent X-Ray and Neutron Scattering (Springer-Verlag, New York, 1992).Google Scholar
2 Ankner, J.F., Majkrzak, C.F., Neumann, D.A., Matheny, A., and Flynn, C.P., Physica B 173, 89 (1991).Google Scholar
3 Zhang, H., submitted to Phys. Rev. B; Zhang, H., Satija, S.K., Gallagher, P.D., Dura, J.A., Ritley, K., Flynn, C.P., and Ankner, J.F., submitted to Phys. Rev. B.Google Scholar