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Piezoresponse Force Microscopy Studies of pc-BiFeO3 Thin Films Produced by the Simultaneous Laser Ablation of Bi and FeO3

Published online by Cambridge University Press:  07 January 2013

C. I. Enriquez-Flores
Affiliation:
CINVESTAV Unidad Querétaro, Lib. Norponiente 2000, Fracc. Real de Juriquilla, Querétaro, Qro., Mexico,
J. J. Gervacio-Arciniega
Affiliation:
CINVESTAV Unidad Querétaro, Lib. Norponiente 2000, Fracc. Real de Juriquilla, Querétaro, Qro., Mexico,
F. J. Flores-Ruiz
Affiliation:
CINVESTAV Unidad Querétaro, Lib. Norponiente 2000, Fracc. Real de Juriquilla, Querétaro, Qro., Mexico,
D. Cardona
Affiliation:
Departamento de Física, Instituto Nacional de Investigaciones Nucleares, Apdo. Postal 18-1027, Mexico D.F., CP 11801, Mexico.
E. Camps
Affiliation:
Departamento de Física, Instituto Nacional de Investigaciones Nucleares, Apdo. Postal 18-1027, Mexico D.F., CP 11801, Mexico.
J. Muñoz-Saldaña
Affiliation:
CINVESTAV Unidad Querétaro, Lib. Norponiente 2000, Fracc. Real de Juriquilla, Querétaro, Qro., Mexico,
F.J. Espinoza-Beltrán
Affiliation:
CINVESTAV Unidad Querétaro, Lib. Norponiente 2000, Fracc. Real de Juriquilla, Querétaro, Qro., Mexico,
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Abstract

Bismuth iron oxide BFO films were produced by the pulsed laser deposition technique. These films are a mixture of BiFeO3 ferroelectrical and Bi25FeO40 piezoelectrical phases. The ferroelectrical domain structure of these films was studied via contact resonance piezoresponse force microscopy (CR-PFM) and resonance tracking PFM (RT-PFM). The proportions of area of these BFO phases were derived from the PFM images. The ferroelectrical domain size corresponds to the size of the BiFeO3 crystals. The CR-PFM and RT-PFM techniques allowed us to be able to distinguish between the ferroelectric domains and the piezoelectric regions existing in the polycrystalline films.

Type
Articles
Copyright
Copyright © Materials Research Society 2012 

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References

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