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Photoreflectance Near-Field Scanning Optical Microscopy

  • Charles Paulson (a1), Brian Hawkins (a2), Jingxi Sun (a2), Arthur B. Ellis (a1), Leon Mccaughan (a3) and T. F. Kuech (a2)...

Abstract

A novel Near-field Scanning Optical Microscopy (NSOM) technique is used to obtain simultaneous topology, photoluminescence and photoreflectance (PR) spectra. PR spectra from GaAs surfaces were obtained and the local electric fields were calculated. Sub-wavelength resolution is expected for this technique and achieved for PL and topology measurements. Photovoltages, resulting from the high intensity of light at the NSOM tip, can limit the spatial resolution of the electric field determination.

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