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Phase Formation in a Wedged Au-Ag-Cu Multilayered Structure

Published online by Cambridge University Press:  21 February 2011

I. Goldfarb ,
E. Zolotoyabko  and
D. Shechtman
I. Goldfarb
Affiliation:
Department of Materials Engineering, Technion - Israel Institute of Technology, Haifa 32000, Israel
E. Zolotoyabko
Affiliation:
Department of Materials Engineering, Technion - Israel Institute of Technology, Haifa 32000, Israel
D. Shechtman
Affiliation:
Department of Materials Engineering, Technion - Israel Institute of Technology, Haifa 32000, Israel
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Abstract

An advanced method for investigation of multicomponent systems is proposed. Thin wedged-shape films of pure components are subsequently deposited to form a multilayered structure with continuously-varying composition as a function of sample location, providing a large number of differently composed samples in one deposition run. Each sample is then subjected to various heat treatments, and phase content as well as the microstructure formed is under investigation.

In this study an Au-Ag-Cu multilayered structure was sputtered at a room temperature onto 55 Formvar-coated Mo grids. The satellite-like X-Ray Diffraction (XRD) patterns of these samples revealed the formation of an artificial composition-modulated ternary superlattice, complete destruction of which was observed during heat treatments, where phase formation according to the ternary Au-Ag-Cu phase diagram took place.

Several aspects of phase formation were analyzed using XRD, Electron Probe for Micro- Analysis (EPMA) in Scanning Electron Microscopy (SEM), and Scanning Transmission Electron Microscopy (STEM) combined with Selected Area Electron Diffraction (SAED), Digital X-Ray Mapping (DXM), Secondary Electron Mapping and EPMA methods.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 311: Symposium O – Phase Transformations in Thin Films–Thermodynamics and Kinetics , 1993 , 39
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Reed, S. J. B., Electron Microprobe Analysis (Cambridge Univ. Press, Cambridge, 1975).Google Scholar
2. Goldfarb, L., Zolotoyabko, E. and Shechtman, D., J. Appl. Phys., submitted.Google Scholar
3. Shinjo, T. in Metalic Surattices, edited by Shinjo, T. and Takada, T. (Elsevier Science Publishers B.V., North-Holland, 1987), p.44.Google Scholar
4. Prince, A., Int. Mater. Rev. 33, 314 (1988).CrossRefGoogle Scholar
5. Kikuchi, R., Sanchez, J. M., DeFontaine, D. and Yamauchi, H., Acta Metall. 28, 651 (1980)CrossRefGoogle Scholar
6. Nakagawa, M. and Yasuda, K., J. Less-Common Met. 138, 97 (1988).CrossRefGoogle Scholar
7. Ogawa, S. and Watanabe, D., J. Phys. Soc. Japan 9, 475 (1954).CrossRefGoogle Scholar
8. Pashley, D. W. and Presland, A. E. B., J. Inst. Met. 87, 419 (1959).Google Scholar
9. Toth, R. S. and Sato, H., J. Appl. Phys. 33, 3250 (1962).CrossRefGoogle Scholar
10. Marcinkowski, M. J. and Zwell, L., Acta Metall. 11, 373 (1963).CrossRefGoogle Scholar
11. Ayer, R. in Materials Problem Solving with the Transmission Electron Mivcroscone, edited by Hobs, L. W., Westmacott, K. H. and Williams, D. B. (Mater. Res. Proc. 62, Boston, Massachusetts, 1985) pp. 193–199.Google Scholar
12. Smith, R. and Bowles, J. S., Acta Metall. 8, 405–415 (1960).CrossRefGoogle Scholar
13. Pashley, D. W. and Presland, A. E. B., Proc. European Reg. Conf. on Electron Microscopy, Delft, 1960, 429 (1961).Google Scholar
14. Pashley, D. W., Robertson, J. L. and Stowell, M. J., Phil. Mag. 19, 83–98 (1969).CrossRefGoogle Scholar