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Oxide Ferroelectric /Cuprate Superconductor Heterostructures: Growth and Properties

  • R. Ramesh (a1), W.K. Chan (a1), H. Gilchrist (a1), B. Wilkens (a1), T. Sands (a1), J.M. Tarascon (a1), V.G. Keramidas (a1), J.T. Evans (a2), F. Dan Gealy (a3) and D.K. Fork (a4)...

Abstract

Ferroelectric PbZr0.2Ti0.8O3/YBa2Cu3O7 heterostructures have been grown on single crystal LaAIO3 and on buffered [100] Si. The cuprate superconductors are used as metal-like bottom electrodes for the subsequent growth of the ferroelectric PZT thin film. Structural studies using x-ray diffraction, and transmission electron microscopy show that the PZT layer is free of large angle grain boundaries (i.e., single crystal-like). Rutherford backscattering studies reveal the composition of the PZT layer to be close to that of the target. Ferroelectric hysteresis measurements using both pulsed measurements and a variable frequency Sawyer-Tower circuit yield remnant polarization values (at 5V) in the range of 15-45μC/cm2 (depending on deposition conditions) with a coercive field in the range of 80-120kV/cm. At a cycling voltage of 5V, these heterostructures exhibit a fatigue lifetime of better than 2x1010 at 40kHz (the polarization decays by only 20% of the initial value). Pulsed poling experiments before and after show that the loss of polarization is reversible. These heterostructures also show excellent aging and logic state retention characteristics.

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