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5. The n-type samples were commercially obtained from ATMI /Epitronics. Qualifying measurements were made with similar samples from Cree Research. No significant differences were observed in analogous spectra.
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9. The correction was performed for the 6H data only. Stray light effects are very pronounced in the relatively broader 6H spectra; thus they are more readily isolated and corrected in these cases. Corrections to the 4H data are accordingly more complex and will be discussed in more detail elsewhere.
Aspnes, D. E., Thin Solid Films, 233, 1 (1993) and references therein.
11. SiO2 thicknesses were comparable to those obtained by removing contaminant/ oxide overlayers in real-time with wet chemical treatments (∼15Å with concentrated Hydroflouric acid) from (0001) and (0001) 4H-SiC surfaces. Cf. Edwards, N.V., Järrendahl, K., Robbie, K., Powell, G., Aspnes, D. E., Cobet, C., Esser, N., Richter, W. and Madsen, L.D.
et al. in manuscript.
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