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Optimization of the Broadband Reflectance of Graded Multilayers for Hard X-Ray Mirrors

Published online by Cambridge University Press:  10 February 2011

Adrian Ivana ,
Ricardo Brunia ,
Kyung Byuna ,
Paul Gorensteina  and
Suzanne Romaine
Adrian Ivana
Affiliation:
Smithsonian Astrophysical Observatory, Cambridge, MA Massachusetts Institute of Technology, Cambridge, MA
Ricardo Brunia
Affiliation:
Smithsonian Astrophysical Observatory, Cambridge, MA
Kyung Byuna
Affiliation:
Smithsonian Astrophysical Observatory, Cambridge, MA Harvard University, Cambridge, MA
Paul Gorensteina
Affiliation:
Smithsonian Astrophysical Observatory, Cambridge, MA
Suzanne Romaine
Affiliation:
Smithsonian Astrophysical Observatory, Cambridge, MA
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Abstract

Multilayer structures with depth graded spacing can present a high reflectivity in a broad energy bandpass for hard X-rays (>20 keV) if the interface roughness/diffuseness is controlled and minimized. We present an optimization study of several multilayer systems deposited by DC magnetron sputtering on <111> silicon wafer substrates. The material combinations presented in this work are W/Si, W/C, Wsi2/Si, Pt/C, Ni/C, and Mo/Si.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 586: Symposium M – Interfacial Engineering for Optimized Properties II , 1999 , 105
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

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